Total reflection x‐ray fluorescence analysis (TXRF) is a special energy‐dispersive x‐ray
analytical technique extending XRF down to the ultra trace element range. Detection limits of …

In this review we provide an overview of the potential of synchrotron radiation techniques to
understand the structural and electronic properties of coordination compounds. Besides the …

Total reflection X-ray fluorescence (TXRF) analysis is a well-established method to monitor
lowest level contamination on semiconductor surfaces. Even light elements on a wafer …

The aim of this article is to review the literature on the application of the total reflection X-ray
fluorescence (TXRF) spectrometry for the determination of the chemical composition of …

Hybrid organometal halide perovskites are known for their excellent optoelectronic
functionality as well as their wide‐ranging chemical flexibility. The composition of hybrid …

The use of synchrotron radiation (SR) as an excitation source for total reflection X-ray
fluorescence analysis (TXRF) offers several advantages over X-ray tube excitation …

X-ray fluorescence can be used not only for the identification/quantification of elements but
also for chemical speciation. The present paper demonstrates the potential feasibility of Kβ …

Detection of rare earth elements (REE) is commonly performed with destructive techniques
such as (LA)-ICPMS or coupled to a destructive sample preparation. When investigating …

This review describes various platforms used for multiplexed spectroscopic analysis. We
highlight the use of different types of spectroscopy for multiplexed detections, including …

Wavelength dispersive X-ray fluorescence (WD-XRF) spectroscopy is a widely used
instrumental spectroscopy method for a variety of samples and it requires no or a minimal of …