We present a novel approach for synthesizing photo-realistic images of people in arbitrary
poses using generative adversarial learning. Given an input image of a person and a …

Yield improvement, yield ramp, and defect screening have been major areas of concern for
the semiconductor industry as technology nodes have advanced. Much effort has been …

Infrared spectral pathology has gained significant attention in the last few years, since it has
been demonstrated to be able to readily identify cancerous tissue in biopsy samples. The …

Test points are inserted into a circuit to improve its testability or diagnosability. The
diagnosability goal may be to reduce the number of indistinguished fault pairs, increase the …

Fast yield ramping in a new technology to meet aggressive time-to-market deadlines
requires a comprehensive design and fabrication methodology for silicon test structures that …

Conventional diagnosis methods are performed at the library cell level, which identify only
defective cells. In reality, many defects affecting the inside of the cells cannot be identified …

At advanced technology nodes, complex interactions between layout features and the
process can lead to manufacturability issues that reduce yield. Due to the huge number of …

Previous work on the Carnegie Mellon Logic Characterization Vehicle (CM-LCV) has
emphasized the diagnosability properties of a specific class of regular circuits called …

The benefits of the continued progress in integrated circuit manufacturing have been
numerous, most notably in the explosion of computing power in devices ranging from cell …

Fault diagnosis plays a major role in IC yield enhancement as it can help identify yield
limiting defects in fabricated devices. The information on such defects is used to guide …