Nanoparticles (NPs) have attracted huge attention in various fields such as materials
science, biology, and chemistry. Green NPs synthesis has been preferred over conventional …

Chitosan (CS) and pea protein isolate (PPI) were used as raw materials to prepare
nanoparticles. The structures and functional properties of the nanoparticles with three ratios …

Perpendicular shape anisotropy (PSA) and double magnetic tunnel junctions (DMTJs) offer
practical solutions to downscale spin-transfer-torque Magnetic Random-Access Memory …

We demonstrate the ability to fabricate vertically stacked Si quantum dots (QDs) within SiGe
nanowires with QD diameters down to 2 nm. These QDs are formed during high-temperature …

Achieving high-quality cross sections is essential for accurate analysis of multilayer
coatings. One method of performing such cross sections is focused ion beam, where sample …

Focused ion beam (FIB) techniques have been frequently used to section metal-halide
perovskites for microstructural investigations. However, the ion beams directly irradiating the …

The selective amorphization of SiGe in Si/SiGe nanostructures via a 1 MeV Si+ implant was
investigated, resulting in single-crystal Si nanowires (NWs) and quantum dots (QDs) …

We report a {001} planar defect found in SiGe nanopillars. The defect structure, determined
by atomic-resolution electron microscopy, matches the Humble defect model proposed for …

The focused ion beam (FIB) is a powerful and versatile tool for site-specific specimen
preparation for advanced microscopy such as transmission electron microscopy (TEM)[1] …

The advancement of electronic nanotechnology hinges on the use of innovative materials
and new conceptual approaches for devices to meet the demand of miniaturization, energy …