A review of band structure and material properties of transparent conducting and semiconducting oxides: Ga2O3, Al2O3, In2O3, ZnO, SnO2, CdO, NiO, CuO, and …

JA Spencer, AL Mock, AG Jacobs, M Schubert… - Applied Physics …, 2022 - pubs.aip.org
This Review highlights basic and transition metal conducting and semiconducting oxides.
We discuss their material and electronic properties with an emphasis on the crystal …

Conduction mechanisms in one dimensional core-shell nanostructures for gas sensing: A review

P Karnati, S Akbar, PA Morris - Sensors and Actuators B: Chemical, 2019 - Elsevier
Metal oxide based core-shell (CS) nanostructures have been studied for gas sensing
applications to mitigate poor selectivity. When designing core-shell nanostructures with nn …

Interpretation of the Changing the Band Gap of Al2O3 Depending on Its Crystalline Form: Connection with Different Local Symmetries

EO Filatova, AS Konashuk - The Journal of Physical Chemistry C, 2015 - ACS Publications
The valence and conduction bands of am-and γ-Al2O3 films grown by the atomic layer
deposition technique were studied simultaneously in identical experimental conditions using …

Hot-electron photodetection with a plasmonic nanostripe antenna

H Chalabi, D Schoen, ML Brongersma - Nano letters, 2014 - ACS Publications
Planar metal–oxide–metal structures can serve as photodetectors that do not rely on the
usual electron–hole pair generation in a semiconductor. Instead, absorbed light in one of the …

Band offsets, Schottky barrier heights, and their effects on electronic devices

J Robertson - Journal of Vacuum Science & Technology A, 2013 - pubs.aip.org
The authors review the band line-ups and band offsets between semiconductors, dielectrics,
and metals, including the theory, experimental data, and the chemical trends. Band offsets …

Band alignment and electrical properties of Al2O3/β-Ga2O3 heterojunctions

T Kamimura, K Sasaki, M Hoi Wong… - Applied Physics …, 2014 - pubs.aip.org
The band alignment of Al 2 O 3/n-Ga 2 O 3 was investigated by x-ray photoelectron
spectroscopy (XPS). With a band gap of 6.8±0.2 eV measured for Al 2 O 3, the conduction …

Interface engineering and chemistry of Hf-based high-k dielectrics on III–V substrates

G He, X Chen, Z Sun - Surface Science Reports, 2013 - Elsevier
Recently, III–V materials have been extensively studied as potential candidates for post-Si
complementary metal-oxide-semiconductor (CMOS) channel materials. The main obstacle …

A review of InP/InAlAs/InGaAs based transistors for high frequency applications

J Ajayan, D Nirmal - Superlattices and Microstructures, 2015 - Elsevier
This paper presents an overview of the rapid progress being made in the development of
InP based devices for high speed applications. Over the past few decades, major aero …

Presence and origin of interface charges at atomic-layer deposited Al2O3/III-nitride heterojunctions

S Ganguly, J Verma, G Li, T Zimmermann… - Applied physics …, 2011 - pubs.aip.org
Unlike silicon and traditional III-V semiconductors, the III-nitrides exhibit high spontaneous
and piezoelectric polarization charges at epitaxial polar heterojunctions. In the process of …

Photoelectric energy conversion of plasmon-generated hot carriers in metal–insulator–semiconductor structures

FP García de Arquer, A Mihi, D Kufer, G Konstantatos - ACS nano, 2013 - ACS Publications
Plasmonic excitation in metals has received great attention for light localization and control
of light-matter interactions at the nanoscale with a plethora of applications in absorption …