Thermo-Mechanical Challenges of 2.5 D Packaging: A Review of Warpage and Interconnect Reliability

H Kim, JY Hwang, SE Kim, YC Joo… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Advanced packaging technology, also known as system scaling, bridges the gap between
chip and package sizes by mounting multiple chips on a single package substrate. 2.5-D …

Reliability Evaluation of Board-Level Flip-Chip Package under Coupled Mechanical Compression and Thermal Cycling Test Conditions

MK Shih, YH Liu, C Lee, CP Hung - Materials, 2023 - mdpi.com
Flip Chip Ball Grid Array (FCBGA) packages, together with many other heterogeneous
integration packages, are widely used in high I/O (Input/Output) density and high …

Bond-line Thickness Prediction for Thermal Interface Material under Usage Conditions

Y Lai, X Jiefeng, J Ha, KA Deo… - 2024 IEEE 74th …, 2024 - ieeexplore.ieee.org
The escalating demand for high-performance computing is driving the expansion of high-
end packages, leading to increased power requirements. Efficient heat dissipation is crucial …

Adhesion Layer Influence on Thermomechanical Reliability of Electroplated Copper Through-Glass Via (TGV)

J Yang, K Pan, P Yin, Y Lai, S Park… - 2024 IEEE 74th …, 2024 - ieeexplore.ieee.org
This study investigated the impact of an adhesion layer on Through Glass Via (TGV)
samples and studied the creep behavior of copper TGVs. TGV samples with and without an …

Influence of Stiffener Design on Co-Packaged Optics (CPO) 2.5 D Heterogeneous Packages

KA Deo, Y Lai, J Yang, JH Ha… - 2024 IEEE 74th Electronic …, 2024 - ieeexplore.ieee.org
The growth in 5G, AI, HPC and IoT have been in the rise in the past few years. This
exponential growth has led to research and development of co-packaged optics (CPO) …

Machine Learning Enhanced Reflow Profiling Approach

Y Lai - 2024 - search.proquest.com
Reflow soldering is a technique that temporarily applies solder paste to contact pads of
numerous surface mount components Reflow profiling is an optimization process to …

Enhanced Foam Package Design for Drop/Impact Using Accurate Predictive Simulation

P Yin, S Park, B Jacob, A Gowda - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
The interconnections and chips of the internal components of electronic devices need to be
protected to prevent damage during shipping, handling, and daily use. This article studied …

A Technical Review on State of the Art In-Plane and Out-of-Plane Deformation Measurement Techniques for Microelectronic Packages

KA Deo, P Yin, J Yang, JH Ha… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
As the industry moves towards miniaturization of electronics, the need for higher accuracy in
in-plane and out-of-plane deformation measurement techniques keeps increasing. Due to a …

Investigation on Fatigue Life of Non-Symmetric Solder Joints in Chip Resistors

J Ha, J Yang, P Yin, KA Deo, C Cai… - 2023 IEEE 73rd …, 2023 - ieeexplore.ieee.org
This study is aimed to find correlation between the fatigue life and solder joint shape with
respect to component location in experimental and numerical approaches. The test vehicle …

Evaluation Airborne Drop Survivability of Electronic Packages

P Yin - 2024 - search.proquest.com
Three types of radiation detectors usually can be found in the market: gas-filled detectors,
scintillation detectors, and solid-state detectors. The ion-chamber type of gas-filled was …