Ion beam tools for nondestructive in-situ and in-operando composition analysis and modification of materials at the Tandem Laboratory in Uppsala
P Ström, D Primetzhofer - Journal of instrumentation, 2022 - iopscience.iop.org
Ion accelerators have demonstrated tremendous versatility in their research applications
throughout several decades. Starting predominantly as nuclear physics tools, they …
throughout several decades. Starting predominantly as nuclear physics tools, they …
[HTML][HTML] An in-situ ToF-LEIS and AES study of near-surface modifications of the composition of EUROFER97 induced by thermal annealing
Surface segregation and diffusion of W, Ta, Cr, O and S after thermal annealing of
EUROFER97 were studied in-situ. The sample was prepared by polishing, annealing up to …
EUROFER97 were studied in-situ. The sample was prepared by polishing, annealing up to …
A new system for sample synthesis, preparation and modification combined with in-situ depth profiling using medium energy ions
R Holeňák, D Moldarev, E Ntemou, T Tsakiris, C Frank… - Vacuum, 2024 - Elsevier
We present equipment for sample synthesis, preparation and modification enabling in-situ
studies employing medium energy ion beams at the ion implanter facility of the Tandem …
studies employing medium energy ion beams at the ion implanter facility of the Tandem …
Thermal chemistry of nickel diketonate Atomic Layer Deposition (ALD) precursors on tantalum and silicon oxide surfaces
The mechanism of the thermal conversion of both bis (2, 2, 6, 6-tetramethyl-3, 5-
heptanedionato) nickel (II)(Ni (TMHD) 2) and the protonated ligand (TMHD-H) adsorbed on …
heptanedionato) nickel (II)(Ni (TMHD) 2) and the protonated ligand (TMHD-H) adsorbed on …
Enhancing Adhesion and Reducing Ohmic Contact through Nickel–Silicon Alloy Seed Layer in Electroplating Ni/Cu/Ag
Z Wang, H Liu, D Chen, Z Wang, K Wu, G Cheng… - Materials, 2024 - mdpi.com
Due to the lower cost compared to screen-printed silver contacts, the Ni/Cu/Ag contacts
formed by plating have been continuously studied as a potential metallization technology for …
formed by plating have been continuously studied as a potential metallization technology for …
Formation of thin films via cold-rolled/annealed nickel sputtering targets
S Li, M Wen, C Wang, Y Wang, Y Shen - Journal of Vacuum Science & …, 2023 - pubs.aip.org
Nickel (Ni) thin films are commonly used in the integrated circuit field. Magnetron sputtering
is a common method for thin film deposition, and the sputtering target is the key raw material …
is a common method for thin film deposition, and the sputtering target is the key raw material …
Direct transition from ultrathin orthorhombic dinickel silicides to epitaxial nickel disilicide revealed by in situ synthesis and analysis
Understanding phase transitions of ultrathin metal silicides is crucial for the development of
nanoscale silicon devices. Here, the phase transition of ultrathin (3.6 nm) Ni silicides on Si …
nanoscale silicon devices. Here, the phase transition of ultrathin (3.6 nm) Ni silicides on Si …
A comprehensive atomistic picture of the as-deposited Ni-Si interface before thermal silicidation process
Despite numerous technological applications associated to nickel silicide thin films, their
formation mechanisms are still far from being understood. We combined experimental and …
formation mechanisms are still far from being understood. We combined experimental and …
Highly oriented NiSi2@ Si thin-nanocomposite produced by solid state diffusion: Morphological and crystallographic characterization
D da Silva Costa, G Kellermann, AF Craievich… - Surfaces and …, 2022 - Elsevier
This article describes a morphological and crystallographic multi-technique characterization
of a 2D-nanocomposite consisting of highly oriented NiSi 2 nanoplates endotaxially grown …
of a 2D-nanocomposite consisting of highly oriented NiSi 2 nanoplates endotaxially grown …
In situ TEM study of Ni-silicides formation up to 973K
Low-temperature solid-state reactions between Ni and Si were studied using in situ
transmission electron microscopy (TEM). In the experiments thin amorphous silicon (a-Si) …
transmission electron microscopy (TEM). In the experiments thin amorphous silicon (a-Si) …