Characterization of the complex permittivity and loss tangent of a dielectric is essential for
broadband and microwave applications. Nonresonant methods are applicable over a wide …

This paper presents a method to obtain the characteristic impedance (ZC) and the complex
permittivity (ε̂) of single-ended and edge-coupled interconnects on printed circuit board …

BiFeO 3 (BFO) thin film nano-structures were grown by pulsed laser deposition (PLD) and
their structural and dielectric responses were investigated over a broad frequency band of …

A method for determining the permittivity and loss tangent of thin-film layers is presented.
The method relies on the measurement of the reflection coefficient to a single metal-insulator …

In this paper we propose a new method of dielectric characterization of high-k thin films
based on the measurement of coplanar capacitor inserts between two coplanar waveguide …

Modern wireless communication systems require low-cost, compact, and highly integrated
tunable components such as filters, phase shifters, frequency-agile antennas, and adaptive …

This thesis is focused on the modeling and characterization of planar interconnects
operating at microwave frequencies covering both, integrated circuit (IC) and printed circuit …

ABSTRACT A model to represent the parasitic series resistance and inductance inherent to
the capacitor plates is proposed. The model is used to determine the frequency‐dependent …

This paper is aimed to present the exact electrical characterization of the SiO 2 thin film
coplanar waveguide (CPW) transmission line. SiO 2 is one of the promising dielectric …

The use of antenna resonance for characterizing the dielectric constant of an FR-4 substrate
is demonstrated. The maximum error in predicting the resonant frequency of a patch …