Due to the increasing scale of high-performance computing (HPC) systems, transient
hardware faults have become a major reliability concern. Consequently, Silent Data …

The recent trend in processor manufacturing technologies has significantly increased the
susceptibility of safety-critical systems against soft errors in harsh environments. Such errors …

The single-event transient (SET) is regarded as one of the critical reliability issues for the soft
errors in modern circuit designs, especially at the advanced technology node. To improve …

As semiconductor technology scales, modern microprocessors are more vulnerable to
transient faults. Software-level fault tolerance schemes are promising because they can …

Mission/safety-critical applications rely on the dependability of their semiconductor control
systems. The lockstepping is state-of-the-art when it comes to their protection. This paper …

Safety/mission-critical applications require high dependability of the control systems. Their
state-of-the-art protection approach is a system-level lockstep. This paper compares the …

We propose a safety-oriented design process for IP-based safety-critical system-on-chip
(SoC). The proposed safety process can facilitate the measurement of the robustness based …

The soft error in SRAM is generated as the single ionizing particle strikes a sensitive node,
which gives rise to Single Event Upsets (SEU)[1]. Here in this paper we design and examine …