[图书][B] Copper wire bonding

PS Chauhan, A Choubey, ZW Zhong, MG Pecht… - 2014 - Springer
Chapter 1 gives an introduction to Cu wire bonding technology. The advantages of Cu over
Au, such as lower cost, higher mechanical strength, and higher electrical and thermal …

Cu wire and Pd-Cu wire package reliability and molding compounds

H Abe, DC Kang, T Yamamoto… - 2012 IEEE 62nd …, 2012 - ieeexplore.ieee.org
Cu wire is drastically replacing Au wire due to surge of Au price. However, Cu wire package
has poorer humidity reliability than Au wire package. Although Pd coated Cu wire package …

Reliability of copper, gold, silver, and PCC wirebonds subjected to harsh environment

P Lall, S Deshpande, L Nguyen - 2018 IEEE 68th Electronic …, 2018 - ieeexplore.ieee.org
Wire bonding is popular first-level interconnect method used in the semiconductor device
packaging. Gold (Ag) wire is often used in high-reliability applications. Typical wire …

Mechanistic study of copper wire-bonding failures on packaging devices in acidic chloride environments

N Ross, M Asokan, GIA Kumar, J Caperton… - Microelectronics …, 2020 - Elsevier
Microelectronic reliability requirements are tightening to a standard of near zero ppb defects
due to the evolution of self-driving cars and wearable electronics. The successful transition …

[HTML][HTML] Influence of Pd-Layer Thickness on Bonding Reliability of Pd-Coated Cu Wire

J Fan, D Yuan, J Du, T Hou, F Wang, J Cao, X Yang… - Micromachines, 2024 - mdpi.com
In this paper, three Pd-coated Cu (PCC) wires with different Pd-layer thicknesses were used
to make bonding samples, and the influence of Pd-layer thickness on the reliability of …

Electrochemical studies of Pd-doped Cu and Pd-doped Cu-Al intermetallics for understanding corrosion behavior in wire-bonding packages

Y Wu, KN Subramanian, SC Barton, A Lee - Microelectronics Reliability, 2017 - Elsevier
This study investigated the electrochemical characterizations in the field of wire metallurgy
(Pd concentration) and molding compound chemistry (chloride concentration) to find ways to …

Ultra-fine pitch palladium-coated copper wire bonding: Effect of bonding parameters

ABY Lim, ACK Chang, O Yauw, B Chylak, CL Gan… - Microelectronics …, 2014 - Elsevier
Copper (Cu) wire bonding has become a mainstream IC assembly solution due to its
significant cost savings over gold wire. However, concerns on corrosion susceptibility and …

Study of tensile properties, electrothermal characteristics and packaging reliability on Cu–Pt–Au–Pd fine micro-alloyed wire

ST Hsu, FY Hung, BD Wu - Journal of Materials Science: Materials in …, 2023 - Springer
In this study, newly developed quaternary micro-alloyed Cu wires (MACs) with added trace
amount of noble metals (Pt, Au, and Pd) added were compared with 4N Cu and Au/Pd …

Effect of palladium on the mechanical properties of Cu–Al intermetallic compounds

ABY Lim, X Long, L Shen, X Chen… - Journal of Alloys and …, 2015 - Elsevier
There is growing interest in copper (Cu) wire bonding due to its significant cost savings over
gold wire. However, concerns regarding package reliability and corrosion susceptibility have …

Interfacial evolution and bond reliability in thermosonic Pd coated Cu wire bonding on aluminum metallization: Effect of palladium distribution

ABY Lim, CB Boothroyd, O Yauw, B Chylak… - Microelectronics …, 2016 - Elsevier
In this paper, the growth kinetics of Cu–Al intermetallic compounds formed during isothermal
annealing of Pd–Cu wire bonds with different palladium distribution at 175° C are …