Lanthanide rare earth oxide thin film as an alternative gate oxide

KH Goh, A Haseeb, YH Wong - Materials Science in Semiconductor …, 2017 - Elsevier
An ultrathin gate oxide is needed for future nanoscale technology due to the density of
integrated circuits will increase exponentially every two to three years as predicted by …

[PDF][PDF] Hf-Based High-κ Dielectrics: A Review.

S Kol, AY Oral - Acta Physica Polonica: A, 2019 - researchgate.net
Silicon oxide has been utilized as gate dielectric material for over 40 years [1]. However,
progressive minimization of transistor dimensions requires the gate oxide layers with very …

Dielectric engineered tunnel field-effect transistor

H Ilatikhameneh, TA Ameen, G Klimeck… - IEEE Electron …, 2015 - ieeexplore.ieee.org
The dielectric engineered tunnel field-effect transistor (DE-TFET) as a high-performance
steep transistor is proposed. In this device, a combination of high-k and low-k dielectrics …

Saving Moore's law down to 1 nm channels with anisotropic effective mass

H Ilatikhameneh, T Ameen, B Novakovic, Y Tan… - Scientific reports, 2016 - nature.com
Scaling transistors' dimensions has been the thrust for the semiconductor industry in the last
four decades. However, scaling channel lengths beyond 10 nm has become exceptionally …

Circuit level analysis of a dual material graded channel (DMGC) cylindrical gate all around (CGAA) FET at nanoscale regime

PK Mudidhe, BR Nistala - ECS Journal of Solid State Science and …, 2023 - iopscience.iop.org
Gate-all around (GAA) device is one of the cutting-edge technologies in the present
semiconductor era owing to enhanced gate controllability and scalability at the nanoscale …

The lattice vibration, mechanical anisotropy, stress-strain behavior and electronic properties of HfxSiy phases: A first-principles study

C Li, X Zhang, F Wang - Vacuum, 2023 - Elsevier
The lattice vibrations, elastic anisotropy, electronic properties and stress-strain behavior of
Hf x Si y phases were predicted using a first-principles calculations. The enthalpies of …

Analysis of surface potential for dual-material-double-gate MOSFET based on modeling and simulation

H Chakrabarti, R Maity, NP Maity - Microsystem Technologies, 2019 - Springer
This paper proposes a 2-D investigative model for fully depleted dual-material-double-gate
(DMDG) metal–oxide–semiconductor-field-effect-transistor (MOSFET) for surface potential …

Dramatic impact of dimensionality on the electrostatics of PN junctions and its sensing and switching applications

H Ilatikhameneh, T Ameen, F Chen… - IEEE Transactions …, 2018 - ieeexplore.ieee.org
Low-dimensional material systems provide a unique set of properties useful for solid-state
devices. The building block of these devices is the pn junction. In this paper, we present a …

An accurate model for threshold voltage analysis of dual material double gate metal oxide semiconductor field effect transistor

H Chakrabarti, R Maity, S Baishya, NP Maity - Silicon, 2021 - Springer
In this article, an accurate representation of threshold voltage for double metal double gate
(DMDG) device structure has been initiated. It is the lowest gate-source electromotive force …

Electrical and thermal performances of omega-shaped-gate nanowire field effect transistors for low power operation

YS Song, S Hwang, KK Min, T Jang… - … of nanoscience and …, 2020 - ingentaconnect.com
In this paper, we proposed Omega-Shaped-Gate Nanowire Field Effect Transistor
(ONWFET) with different gate coverage ratio (GCR). In order to investigate electrical and self …