Thermal-Dynamic analysis research on the designed Impingement-Jet Double-Layer nested microchannel heat sinks with vertical truncated bifurcation

X Cao, X Lan, S Gao, CC Wang, H Shen - Applied Thermal Engineering, 2024 - Elsevier
The heat flux density of modern micro devices is far greater than the heat dissipation
capacity of traditional cooling methods. In order to further improve the comprehensive …

The optimization and analysis of a triple-fin heterostructure-on-insulator fin field-effect transistor with a stacked high-K configuration and 10 nm channel length

P Saha, R Sankar Dhar, S Nanda, K Kumar… - Nanomaterials, 2023 - mdpi.com
The recent developments in the replacement of bulk MOSFETs with high-performance
semiconductor devices create new opportunities in attaining the best device configuration …

Development and analysis of a three-fin trigate Q-FinFET for a 3 nm technology node with a strained-silicon channel system

S Nanda, RS Dhar, F Awwad, MI Hussein - Nanomaterials, 2023 - mdpi.com
Multi-gate field effect transistors (FETs) such as FinFETs are severely affected by short-
channel effects (SCEs) below 14 nm technology nodes, with even taller fins incurring …

Electrothermal Modeling of Multi-Nanosheet FETs With Various Layouts

W Kwon, C Yoo, J Jeon - IEEE Transactions on Electron …, 2024 - ieeexplore.ieee.org
In this study, we propose a highly accurate and rapidly analyzable electrothermal modeling
for the observed self-heating effect (SHE) characteristics in multinanosheet FETs (mNS …

Exploration and analysis of n-FinFET implementing stacked high-K at 08 nm gate length

S Nanda, S Kumari, RS Dhar - Sādhanā, 2023 - Springer
FinFETs ensured the continuation of semiconductor industry with reliable, high performance
and low power devices fabricated at sub-100 nm technology nodes. These FinFETs are able …

Effect of Temperature, Doping and Gate Material Engineering on Tri-Gate SOI nFinFET Performance Through TCAD Simulation

S Panda, RS Parida, GC Dora, R Swain… - … on Electrical and …, 2024 - Springer
Temperature, doping concentration, and gate work function all have a significant impact on
performance of transistor during miniaturization. The design and in-depth investigation of a …

Design and Performance Analysis of 3-Fin 08 nm Physical Gate Length SOI FinFETs Employing Gate Stacked High-K Dielectrics

S Nanda, S Kumari, RS Dhar - 2023 IEEE 3rd International …, 2023 - ieeexplore.ieee.org
The continuation of the scaling of FinFETs in the nano regime guaranteed the continuance
of semiconductor industry with the fabrication of reliable, high performance and low power …

[PDF][PDF] Development and Analysis of a Three-Fin Trigate Q-FinFET for a 3 nm Technology Node with a Strained-Silicon Channel System. Nanomaterials 2023, 13 …

S Nanda, RS Dhar, F Awwad, MI Hussein - 2023 - academia.edu
Multi-gate field effect transistors (FETs) such as FinFETs are severely affected by
shortchannel effects (SCEs) below 14 nm technology nodes, with even taller fins incurring …