Diffraction gratings: from principles to applications in high-intensity lasers

N Bonod, J Neauport - Advances in Optics and Photonics, 2016 - opg.optica.org
Diffraction gratings were discovered during the 18th century, and they are now widely used
in spectrometry analysis, with outstanding achievements spanning from the probing of single …

An insight into optical metrology in manufacturing

Y Shimizu, LC Chen, DW Kim, X Chen… - Measurement …, 2021 - iopscience.iop.org
Optical metrology is one of the key technologies in today's manufacturing industry. In this
article, we provide an insight into optical measurement technologies for precision …

[HTML][HTML] FEM-based modeling of microsphere-enhanced interferometry

T Pahl, L Hüser, S Hagemeier… - Light: Advanced …, 2022 - light-am.com
To improve the lateral resolution in microscopic imaging, microspheres are placed close to
the object's surface in order to support the imaging process by optical near-field information …

[图书][B] GratinGs: theory and numeric applications

E Popov - 2012 - books.google.com
Since the 80's, specialists of gratings can rely on very powerful grating softwares [1-6].
These softwares are able to compute grating efficiencies for almost any kind of grating in any …

Quasimodal expansion of electromagnetic fields in open two-dimensional structures

B Vial, F Zolla, A Nicolet, M Commandré - Physical Review A, 2014 - APS
A quasimodal expansion method (QMEM) is developed to model and understand the
scattering properties of arbitrary shaped two-dimensional open structures. In contrast with …

3D modeling of coherence scanning interferometry on 2D surfaces using FEM

T Pahl, S Hagemeier, M Künne, D Yang… - Optics Express, 2020 - opg.optica.org
Despite the fact that optical profilers, such as coherence scanning interferometers, are
frequently used for fast and contactless topography measurements in various fields of …

[PDF][PDF] 集成电路制造在线光学测量检测技术: 现状, 挑战与发展趋势

陈修国, 王才, 杨天娟, 刘佳敏, 罗成峰… - Laser & Optoelectronics …, 2022 - researching.cn
摘要在线测量检测技术与装备是保证集成电路(IC) 制造质量和良率的唯一有效技术手段, 在IC
制造过程中必须对IC 纳米结构的关键尺寸, 套刻误差, 以及缺陷等进行快速, 非破坏 …

An adaptive edge element method with perfectly matched absorbing layers for wave scattering by biperiodic structures

G Bao, P Li, H Wu - Mathematics of Computation, 2010 - ams.org
An edge element adaptive strategy with error control is developed for wave scattering by
biperiodic structures. The unbounded computational domain is truncated to a bounded one …

Developing finite element methods for Maxwell's equations in a Cole–Cole dispersive medium

J Li, Y Huang, Y Lin - SIAM Journal on scientific computing, 2011 - SIAM
In this paper, we consider the time-dependent Maxwell's equations when Cole–Cole
dispersive medium is involved. The Cole–Cole model contains a fractional time derivative …

The finite element method as applied to the diffraction by an anisotropic grating

G Demésy, F Zolla, A Nicolet, M Commandré… - Optics …, 2007 - opg.optica.org
The main goal of the method proposed in this paper is the numerical study of various kinds
of anisotropic gratings deposited on isotropic substrates, without any constraint upon the …