Advancements in mechanical characterization techniques and environmental effects on bi-material interfaces in microelectronics: a literature review
RA Ferreira, A Akhavan-Safar, RJC Carbas… - The Journal of …, 2024 - Taylor & Francis
Chip packaging engineering has evolved significantly to meet the performance demands of
integrated circuits (IC) and micro-electromechanical systems (MEMS). Layers, mainly …
integrated circuits (IC) and micro-electromechanical systems (MEMS). Layers, mainly …
Mixed mode fracture toughness of epoxy molding compound/printed circuit board interface of semiconductor packages with respect to temperature and moisture
HJ Um, SM Lee, DW Lee, S Ha, HS Kim - Engineering Fracture Mechanics, 2023 - Elsevier
Interfacial delamination is a critical factor for dissimilar bi-material interfaces in terms of
structural mechanical behavior and reliability. In this study, the mixed mode interfacial …
structural mechanical behavior and reliability. In this study, the mixed mode interfacial …
Experimental and numerical investigation of delamination between epoxy molding compound (EMC) and metal in encapsulated microelectronic packages
MK Shih, YH Liu, GS Lin, E Hsu, J Yang - Experimental Techniques, 2024 - Springer
Microelectronics packages play a vital role in not only interconnecting the electronic signals
from the die to the printed circuit board (PCB), but also in protecting the chips during the …
from the die to the printed circuit board (PCB), but also in protecting the chips during the …
Novel characterization method of chip level hybrid bonding strength
J Kim, K Lim, SH Hahn, M Lee… - 2021 IEEE 71st …, 2021 - ieeexplore.ieee.org
A new characterization method for interfacial adhesion between die to die hybrid bonding
interface at chip level is developed to evaluate and analyze the adhesion strength. Die to …
interface at chip level is developed to evaluate and analyze the adhesion strength. Die to …
High-temperature interfacial adhesion strength measurement in electronic packaging using the double cantilever beam method
S Sankarasubramanian, J Cruz… - Journal of …, 2017 - asmedigitalcollection.asme.org
This paper describes the use of the double cantilever beam (DCB) method for characterizing
the adhesion strength of interfaces in advanced microelectronic packages at room and high …
the adhesion strength of interfaces in advanced microelectronic packages at room and high …
Adhesion strength of die attach film for thin electronic package at elevated temperature
BR Mose, IS Son, DK Shin - Microelectronics Reliability, 2018 - Elsevier
Adhesion strength of a thin film for electronic packaging was investigated. The effects of
temperature and loading rate on the adhesion were observed considering the viscoelasticity …
temperature and loading rate on the adhesion were observed considering the viscoelasticity …
고주파수용저유전및저손실의폴리머-세라믹타입Photo Solder Resist
남현진, 신민경, 정재웅, 조영빈, 박윤식, 유종인… - 폴리머, 2023 - dbpia.co.kr
본 연구에서는 기성 photo solder resist (PSR) 를 다양한 소재를 활용하여 유전 특성이 우수한
소재로 개발을 진행하였다. 다양한 소재는 유전율이 낮은 소재 자체 개발품의 폴리이미드와 …
소재로 개발을 진행하였다. 다양한 소재는 유전율이 낮은 소재 자체 개발품의 폴리이미드와 …
Aging of Polymer Adhesives and Its Reliability Impacts to Electronics Packaging
R Liu - 2020 - search.proquest.com
The I/O density growth of the system-on-chip (SoC) technology has been following Moore's
Law, which is approaching its limit due to physical node scaling challenges. 2.5 D …
Law, which is approaching its limit due to physical node scaling challenges. 2.5 D …