Probing the emission properties of color centers in MgAl2O4 wafers using hard X-ray nanoprobes

ER Wang, TC Huang, YH Chang, YH Wu, SW Ke… - Optical Materials, 2023 - Elsevier
In this study, we used hard X-ray-excited optical luminescence (XEOL) to investigate the
emission properties of MgAl 2 O 4 wafers with a crystal orientation of (100),(110), or (111) …