Perspectives on the theory of defects
J Spitaler, SK Estreicher - Frontiers in Materials, 2018 - frontiersin.org
Our understanding of defects in materials science has changed tremendously over the last
century. While 100 years ago they were often ignored by scientists, nowadays they are in the …
century. While 100 years ago they were often ignored by scientists, nowadays they are in the …
Native surface oxide turns alloyed silicon membranes into nanophononic metamaterials with ultralow thermal conductivity
A detailed understanding of the relation between microscopic structure and phonon
propagation at the nanoscale is essential to design materials with desired phononic and …
propagation at the nanoscale is essential to design materials with desired phononic and …
Self-diffusion in crystalline silicon: A single diffusion activation enthalpy down to
Self-diffusion in silicon and the contribution of vacancies and self-interstitials have been
controversially discussed for 50 yr. Most recent results show that the intrinsic silicon self …
controversially discussed for 50 yr. Most recent results show that the intrinsic silicon self …
Electrical and thermal transport properties of medium-entropy SiyGeySnx alloys
Electrical and thermal transport properties of disordered materials have long been of both
theoretical interest and engineering importance. As a new class of materials with an intrinsic …
theoretical interest and engineering importance. As a new class of materials with an intrinsic …
[HTML][HTML] Advanced hydrogenation process applied on Ge on Si quantum dots for enhanced light emission
For the development of photonic integrated circuits, it is mandatory to implement light
sources on a Si-on-insulator (SOI) platform. However, point defects in the Si matrix and, eg …
sources on a Si-on-insulator (SOI) platform. However, point defects in the Si matrix and, eg …
Synthesis of nonepitaxial multilayer silicene assisted by ion implantation
HS Tsai, CH Hsiao, CW Chen, H Ouyang, JH Liang - Nanoscale, 2016 - pubs.rsc.org
Nonepitaxial multilayer silicene with a lonsdaleite structure was synthesized from a 4H-SiC
substrate using an implantation-assisted process. An sp3-like bonding signal was fitted in a …
substrate using an implantation-assisted process. An sp3-like bonding signal was fitted in a …
The mechanism of the irradiation synergistic effect of silicon bipolar junction transistors explained by multiscale simulations of Monte Carlo and excited-state first …
Z Yang, Y Liu, N An, X Chen - The Journal of Chemical Physics, 2023 - pubs.aip.org
Neutron and γ-ray irradiation damages to transistors are found to be non-additive, and this is
denoted as the irradiation synergistic effect (ISE). Its mechanism is not well-understood. The …
denoted as the irradiation synergistic effect (ISE). Its mechanism is not well-understood. The …
Optical properties of GeO [SiO] and GeO [SiO2] solid alloy layers grown at low temperature
SG Cherkova, VA Volodin, F Zhang, M Stoffel… - Optical Materials, 2021 - Elsevier
The optical properties of GeO [SiO] and GeO [SiO 2] solid alloy films grown on Si (001)
substrates were studied using Raman, Fourier transform infrared absorption (FTIR) and …
substrates were studied using Raman, Fourier transform infrared absorption (FTIR) and …
Self-diffusion in amorphous silicon
F Strauß, L Dörrer, T Geue, J Stahn, A Koutsioubas… - Physical review …, 2016 - APS
The present Letter reports on self-diffusion in amorphous silicon. Experiments were done on
Si 29/Si nat heterostructures using neutron reflectometry and secondary ion mass …
Si 29/Si nat heterostructures using neutron reflectometry and secondary ion mass …
Electron and proton irradiation effect on the minority carrier lifetime in SiC passivated p-doped Ge wafers for space photovoltaics
C Weiss, S Park, J Lefèvre, B Boizot, C Mohr… - Solar Energy Materials …, 2020 - Elsevier
We report on the effect of electron and proton irradiation on effective minority carrier lifetimes
(τ eff) in p-type Ge wafers. Minority carrier lifetimes are assessed using the microwave …
(τ eff) in p-type Ge wafers. Minority carrier lifetimes are assessed using the microwave …