PVT variability analysis of FinFET and CMOS XOR circuits at 16nm
FGRG da Silva, PF Butzen… - 2016 IEEE International …, 2016 - ieeexplore.ieee.org
This work compares many different transistors arrangements of XOR logic gates under PVT
variability effect in 16nm device technologies: CMOS Bulk and FinFET. The objective is to …
variability effect in 16nm device technologies: CMOS Bulk and FinFET. The objective is to …
[PDF][PDF] Avalição e comparação de diferentes topologias de XOR para desempenho e consumo de potência
Este artigo apresenta análise e comparação entre diferentes arquiteturas da porta lógica
XOR. O principal objetivo é comparar características elétricas e verificar quais arquiteturas …
XOR. O principal objetivo é comparar características elétricas e verificar quais arquiteturas …
[PDF][PDF] Temperature Fluctuation Effects on Performance of XOR Logic Gates
FGRG da Silva, R Grande, VS Rosa, C Meinhardt… - sbmicro.org.br
This paper presents analysis and comparison between different transistor arrangements of
XOR logic gates when temperature fluctuation is evaluated. The objective is to compare and …
XOR logic gates when temperature fluctuation is evaluated. The objective is to compare and …
[PDF][PDF] Process Variability Effects on Performance and Power Consumption of XOR Logic Gates
FGRG da Silva, VS Rosa, C Meinhardt - academia.edu
This paper presents analysis and comparison between different transistor arrangements of
XOR logic gates. The main objective is to compare and verify electrical characteristics, and …
XOR logic gates. The main objective is to compare and verify electrical characteristics, and …