Area-selective deposition: fundamentals, applications, and future outlook

GN Parsons, RD Clark - Chemistry of Materials, 2020 - ACS Publications
This review provides an overview of area-selective thin film deposition (ASD) with a primary
focus on vapor-phase thin film formation via chemical vapor deposition (CVD) and atomic …

Materials to systems co-optimization platform for rapid technology development targeting future generation CMOS nodes

EM Bazizi, A Pal, J Kim, L Jiang… - … on Electron Devices, 2021 - ieeexplore.ieee.org
Design technology co-optimization (DTCO) has been a workhorse in optimizing logic
technology innovations for a few generations now. With increased complexity associated …

Electrical coupling effect of forksheet FET for power, performance, and area analysis

J Lee, JS Yoon, J Lim, RH Baek - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
We analyze the electrical coupling effect of a fork-shaped field-effect transistor (FSFET) and
compare FSFET and the nanosheet FET (NSFET) in terms of logic cell power, performance …

Semi-damascene integration of a 2-layer MOL VHV scaling booster to enable 4-track standard cells

V Vega-Gonzalez, D Radisic… - 2022 International …, 2022 - ieeexplore.ieee.org
A new cell routing architecture called vertical-horizontal-vertical (VHV) which requires a two-
level (2L) middle-of-line (MOL) scheme has been proposed as a scaling booster to enable 4 …

Standard cell architectures for N2 node: transition from FinFET to nanosheet and to forksheet device

B Chehab, P Weckx Sr, J Ryckaert Sr… - … Co-optimization for …, 2020 - spiedigitallibrary.org
N2 node is introduced at 42nm poly pitch (CPP), 16 metal pitch (MP) by using 5 tracks (5T)
cell height, single fin, and buried power rail (BPR). Due to the extreme cell height reduction …

Improving performance and power by co-optimizing middle-of-line routing, pin pattern generation, and contact over active gates in standard cell layout synthesis

S Chung, J Jeong, T Kim - Proceedings of the ACM/IEEE International …, 2022 - dl.acm.org
This paper addresses the combined problem of the three core tasks, namely routing on the
middle-of-line (MOL) layer, generating I/O pin patterns (PP), and allocating contacts over …

Characterization of Silicon FinFETs under Nanoscale Dimensions

RH Baek, JS Yoon - … Devices and Technologies for Future Ultra …, 2021 - taylorfrancis.com
Silicon fin-shaped field-effect transistors (FinFETs) have been first introduced in 22 nm node
by enhancing gate-to-channel controllability over planar MOSFETs. As the self-aligned …

Sequential 3D standard cell 4T architecture using design crenellation and self-aligned MOL for N2 technology and beyond

P Weckx, B Chehab, J Ryckaert… - … Co-optimization for …, 2020 - spiedigitallibrary.org
As traditional pitch scaling is losing steam, 3D logic is being explored to further extend
density scaling as an alternative to continued standard cell scaling. This paper will discuss …