We compare synchronous dataflow (SDF) and cyclo-static dataflow (CSDF), which are each
special cases of a model of computation we call dataflow process networks. In SDF actors …

At-speed scan is a key technique in modern IC testing. One of its drawbacks, with respect to
functional tests, is its excessive power consumption leading to voltage drop and frequency …

The major VLSI circuits like sequential circuits, linear chips and op amps are very important
elements to provide many logic functions. Today's competitive devices like cell phone, tabs …

Dependence analysis is useful for software maintenance because it indicates the possible
effects of a software modification on the rest of a program. This helps the software maintainer …

The paper explores the effects of power-supply droop during scan based at-speed test
application. The unnatural supply voltage profile that results when the capture clocks are …

Small delay faults may be an indicator of a reliability threat, even if they do not affect the
system functionality yet. In recent years, Faster-than-at-Speed-Test (FAST) has become a …

In safety-critical applications, microcontrollers must be compliant with the required quality
constraints and performance standards, particularly in terms of the maximum operating …

The testing of integrated circuits is an important topic, particularly in safety-critical
applications. This is especially true for microcontrollers (MCUs) used in the automotive …

Voltage transients from circuit activity impact operation, testing and debug of complex
designs. This paper describes a system which enables voltage transient detection and a …

Recently FPGA researchers have proposed different approaches to enable dynamic voltage
scaling (DVS) for FPGAs. While the proposed approaches have shown that DVS is able to …