Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy
In the last years there has been a renewed interest for zinc oxide semiconductor, mainly
triggered by its prospects in optoelectronic applications. In particular, zinc oxide thin films …
triggered by its prospects in optoelectronic applications. In particular, zinc oxide thin films …
Origin of Photocatalytic Activity in Ti4+/Ti3+ Core–Shell Titanium Oxide Nanocrystals
Colored titanium dioxide (TiO2) nanocrystals have been studied intensively in recent years
due to their substantial solar-driven photocatalytic activities. Because of the scarcity of …
due to their substantial solar-driven photocatalytic activities. Because of the scarcity of …
Fermi level tuning of ZnO films through supercycled atomic layer deposition
A novel supercycled atomic layer deposition (ALD) process which combines thermal ALD
process with in situ O 2 plasma treatment is presented in this work to deposit ZnO thin films …
process with in situ O 2 plasma treatment is presented in this work to deposit ZnO thin films …
Hydrogenated ZnO thin film with p-type surface conductivity from plasma treatment
Fabrication of a ZnO pn homojunction within a single structure by a simple process is a
challenging task. In this work, an intrinsic p-type surface conductive layer of ZnO with a …
challenging task. In this work, an intrinsic p-type surface conductive layer of ZnO with a …
Controlling ZnO nanowire surface density during its growth by altering morphological properties of a ZnO buffer layer by UV laser irradiation
T Shimogaki, H Kawahara, S Nakao, M Higashihata… - Applied Physics A, 2015 - Springer
Zinc oxide (ZnO) nanocrystals, which are characterized by their configurations and fine
structures, are unique oxide semiconductors. In this report, it is demonstrated that the …
structures, are unique oxide semiconductors. In this report, it is demonstrated that the …
Quantitative analysis of kelvin probe force microscopy on semiconductors
L Polak, RJ Wijngaarden - Kelvin Probe Force Microscopy: From Single …, 2018 - Springer
As is well known, Kelvin Probe Force Microscopy (KPFM) is a powerful and versatile tool to
measure the contact potential difference (CPD) in metals. Here, we discuss the application …
measure the contact potential difference (CPD) in metals. Here, we discuss the application …
Surface photovoltage analysis of ZnO nanorods/p-Si heterostructure
D Kang, J Bian, Y Sang, A Liu, J Sun, J Xuan - Materials science in …, 2013 - Elsevier
In this work, n-type ZnO nanorods (NRs) were fabricated on a p-type Si substrate to form a
ZnO NRs/Si structure using a low-temperature wet chemical bath deposition method. Kelvin …
ZnO NRs/Si structure using a low-temperature wet chemical bath deposition method. Kelvin …
[引用][C] Materiály na bázi TiO2 modifikované kovy pro fotokatalytickou redukci oxidu uhličitého
M Reli - 2013 - dspace.vsb.cz
Disertační práce se zabývala studiem fotokatalytické redukce oxidu uhličitého ve vodném
roztoku hydroxidu sodného v přítomnosti katalyzátorů na bázi TiO2. Celkem byly testovány …
roztoku hydroxidu sodného v přítomnosti katalyzátorů na bázi TiO2. Celkem byly testovány …