Genetic algorithms, a nature-inspired tool: survey of applications in materials science and related fields

W Paszkowicz - Materials and Manufacturing Processes, 2009 - Taylor & Francis
Genetic algorithms (GAs) are a tool used to solve high-complexity computational problems.
Apart from modelling the phenomena occurring in Nature, they help in optimization …

Comparing magnetic ground-state properties of the V- and Cr-doped topological insulator

A Tcakaev, VB Zabolotnyy, RJ Green, TRF Peixoto… - Physical Review B, 2020 - APS
An insulating ferromagnetic ground state is a fundamental prerequisite for the quantum
anomalous Hall (QAH) effect observed in magnetically doped topological insulators such as …

[HTML][HTML] Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

D Ingerle, F Meirer, G Pepponi, E Demenev… - … Acta Part B: Atomic …, 2014 - Elsevier
The continuous downscaling of the process size for semiconductor devices pushes the
junction depths and consequentially the implantation depths to the top few nanometers of …

Techniques to improve the accuracy of noise power spectrum measurements in digital x‐ray imaging based on background trends removal

Z Zhou, F Gao, H Zhao, L Zhang - Medical physics, 2011 - Wiley Online Library
Purpose: Noise characterization through estimation of the noise power spectrum (NPS) is a
central component of the evaluation of digital x‐ray systems. Extensive works have been …

MROX 2.0: a software tool to explore quantum heterostructures by combining X-ray reflectivity and diffraction

S Magalhães, C Cachim, PD Correia, F Oliveira… - …, 2023 - pubs.rsc.org
New software for the simulation and fitting of specular X-ray reflectivity (XRR) measurements
has been developed. The novel software employs the recursive formalism of the dynamical …

Coupling of Fe and uncompensated Mn moments in exchange-biased Fe/MnPd

S Brück, S Macke, E Goering, X Ji, Q Zhan… - Physical Review B …, 2010 - APS
A bilayer exchange-bias system composed of Fe/MnPd is investigated using x-ray magnetic
circular dichroism (XMCD) and soft x-ray resonant magnetic reflectometry (XRMR). The …

Accuracy in x-ray reflectivity analysis

J Tiilikainen, JM Tilli, V Bosund, M Mattila… - Journal of Physics D …, 2007 - iopscience.iop.org
The influence of Poisson noise on the accuracy of x-ray reflectivity analysis is studied with
an aluminium oxide (AlO) layer on silicon. A null hypothesis which argues that other than the …

Grazing incidence X-ray reflectivity and scattering

BK Tanner - 2018 - durham-repository.worktribe.com
Grazing Incidence X-Ray Reflectivity and Scattering Skip to main content Durham Research
Online (DRO) Home Research Outputs People Faculties and Departments Research …

[PDF][PDF] Indexed bibliography of genetic algorithms and neural networks

JT Alander - University of Vaasa, Department of Information …, 1994 - researchgate.net
An Indexed Bibliography of Genetic Algorithms and Neural Networks Page 1 An Indexed
Bibliography of Genetic Algorithms and Neural Networks compiled by Jarmo T. Alander …

Novel method for error limit determination in x-ray reflectivity analysis

J Tiilikainen, M Mattila, T Hakkarainen… - Journal of physics D …, 2008 - iopscience.iop.org
A novel error limit determination method for x-ray reflectivity (XRR) analysis is developed
and applied to data measured from atomic-layer-deposited aluminium oxide on silicon. The …