Understanding and exploiting the interaction of electron beams with low-dimensional materials-fro...

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[HTML][HTML] Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations

C Hofer, V Skákalová, J Haas, X Wang, K Braun… - Ultramicroscopy, 2021 - Elsevier
The simple dependence of the intensity in annular dark field scanning transmission electron
microscopy images on the atomic number provides (to some extent) chemical information …
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Enabling true atomic-scale analytical imaging, application to solute segregation at crystal defects in high-temperature materials

F Ferraz Morgado de Oliveira - 2024 - hss-opus.ub.ruhr-uni-bochum.de
RUB-Repository - Enabling true atomic-scale analytical imaging, application to solute segregation
at crystal defects in high-temperature materials Deutsch OPUS UB Bochum RUB » …
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