In this paper, an oscillation-based built-in self-test system for active an analog integrated
circuit is presented. This built-in self-test system was used to detect catastrophic and …

Application of built-in self-test circuitries allows to improve the testing quality and reliability of
complex analog and mixed-signal IC. BIST-circuitry is integrated to original circuit for the …

This paper proposes the test of high-order switched-capacitor (SC) ladder filters by means of
the oscillation-based test (OBT). The OBT implementation requires converting the filter under …

In this paper, different number of stages of the active RC low-pass filters were investigated
for detection range of parametric faults using on-chip built-in self-test system. As filter testing …

In this paper, different types of feedback circuits for on-chip built-in self-test were
investigated. As testing system, an oscillation type built-in self-test was designed and it was …

This work evaluates the ability of OBT for detecting parametric faults in continuous-time
filters. To this end, we adopt two filters with quite different topologies as cases of study and a …

The structural solution of built-in self test for analog and mixed-signal IC based on
reconfiguring original circuit in oscillator has been proposed. The principles of functioning …

In this work, we evaluate the ability of Oscillation-Based Test (OBT) for detecting in
continuous-time filters, more realistic parametric faults. As a case study, we consider a low …

Este trabajo analiza el uso del test de filtros en escalera de tiempo continuo de alto orden
por medio del test basado en oscilaciones (OBT). La implementación de OBT requiere …

Recent advances in semiconductor technologies enable the integration of previously
disparate designs into a single system-on-chip (SOC). While the SOC offers significant …