[HTML][HTML] fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy
M Tkadletz, M Schiester, H Waldl, G Schusser… - Materials Today …, 2024 - Elsevier
For atom probe tomography (APT) and transmission electron microscopy (TEM) half grids
are commonly applied as specimen carriers, serving as mount for focused ion beam (FIB) …
are commonly applied as specimen carriers, serving as mount for focused ion beam (FIB) …
Mapping the path to Cryogenic Atom Probe Tomography Analysis of biomolecules
The understanding of protein structure, folding, and interaction with other proteins remains
one of the grand challenges of modern biology. Tremendous progress has been made …
one of the grand challenges of modern biology. Tremendous progress has been made …