An overview of normally-off GaN-based high electron mobility transistors

F Roccaforte, G Greco, P Fiorenza, F Iucolano - Materials, 2019 - mdpi.com
Today, the introduction of wide band gap (WBG) semiconductors in power electronics has
become mandatory to improve the energy efficiency of devices and modules and to reduce …

Recent advances in GaN‐based power HEMT devices

J He, WC Cheng, Q Wang, K Cheng… - Advanced electronic …, 2021 - Wiley Online Library
The ever‐increasing power density and operation frequency in electrical power conversion
systems require the development of power devices that can outperform conventional Si …

GaN-based power devices: Physics, reliability, and perspectives

M Meneghini, C De Santi, I Abid, M Buffolo… - Journal of Applied …, 2021 - pubs.aip.org
Over the last decade, gallium nitride (GaN) has emerged as an excellent material for the
fabrication of power devices. Among the semiconductors for which power devices are …

Reliability, applications and challenges of GaN HEMT technology for modern power devices: A review

N Islam, MFP Mohamed, MFAJ Khan, S Falina… - Crystals, 2022 - mdpi.com
A new generation of high-efficiency power devices is being developed using wide bandgap
(WBG) semiconductors, like GaN and SiC, which are emerging as attractive alternatives to …

A comprehensive review of recent progress on GaN high electron mobility transistors: Devices, fabrication and reliability

F Zeng, JX An, G Zhou, W Li, H Wang, T Duan, L Jiang… - Electronics, 2018 - mdpi.com
GaN based high electron mobility transistors (HEMTs) have demonstrated extraordinary
features in the applications of high power and high frequency devices. In this paper, we …

Frequency- and Temperature-Dependent Gate Reliability of Schottky-Type -GaN Gate HEMTs

J He, J Wei, S Yang, Y Wang, K Zhong… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
In this paper, we carried out a systematic investigation on gate degradation and the physical
mechanism of the Schottky-type p-GaN gate HEMTs under positive gate voltage stress. The …

Development of GaN HEMTs fabricated on silicon, silicon-on-insulator, and engineered substrates and the heterogeneous integration

LH Hsu, YY Lai, PT Tu, C Langpoklakpam, YT Chang… - Micromachines, 2021 - mdpi.com
GaN HEMT has attracted a lot of attention in recent years owing to its wide applications from
the high-frequency power amplifier to the high voltage devices used in power electronic …

High gain and high ultraviolet/visible rejection ratio photodetectors using p-GaN/AlGaN/GaN heterostructures grown on Si

Q Lyu, H Jiang, KM Lau - Applied Physics Letters, 2020 - pubs.aip.org
We report high performance ultraviolet (UV) photodetectors (PDs) based on p-GaN-gated
AlGaN/GaN heterostructures grown on silicon substrates. Benefitting from the high electrical …

1300 V normally-OFF p-GaN gate HEMTs on Si with high ON-state drain current

H Jiang, Q Lyu, R Zhu, P Xiang… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
In this article, we demonstrate normally-OFF p-GaN gate high electron mobility transistors
(HEMTs) on Si with an ultrahigh breakdown voltage () and excellent saturation drain current …

High-responsivity and fast-response ultraviolet phototransistors based on enhanced p-GaN/AlGaN/GaN HEMTs

H Wang, H You, Y Xu, X Sun, Y Wang, D Pan… - ACS …, 2022 - ACS Publications
We report high-performance visible-blind ultraviolet (UV) phototransistors (PTs) based on an
enhanced HEMT structure. In dark conditions, the conduction channel was depleted, and the …