Thin film depth profiling by ion beam analysis
The analysis of thin films is of central importance for functional materials, including the very
large and active field of nanomaterials. Quantitative elemental depth profiling is basic to …
large and active field of nanomaterials. Quantitative elemental depth profiling is basic to …
Development and applications of STIM-and PIXE-tomography: A review
C Michelet, P Barberet, P Moretto, H Seznec - Nuclear Instruments and …, 2015 - Elsevier
In combination with nuclear microprobes, STIM and PIXE tomography offer non-destructive
quantitative three-dimensional characterization of microscopic samples. STIM tomography …
quantitative three-dimensional characterization of microscopic samples. STIM tomography …