High resonance frequency force microscope scanner using inertia balance support
We have developed the atomic force microscope scanner with the high resonance
frequency of 540 kHz in the z axis using a piezosupport mechanism “inertia balance …
frequency of 540 kHz in the z axis using a piezosupport mechanism “inertia balance …
Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator
Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM)
was performed using a 1 MHz length-extension type of quartz resonator as a force sensor …
was performed using a 1 MHz length-extension type of quartz resonator as a force sensor …
Molecular-resolution imaging of lead phthalocyanine molecules by small amplitude frequency modulation atomic force microscopy using second flexural mode
T Ichii, Y Hosokawa, K Kobayashi… - Applied Physics …, 2009 - pubs.aip.org
Lead phthalocyanine molecules on MoS 2 (0001) substrates were imaged using an
ultrahigh-vacuum AFM apparatus equipped with an optical beam deflection (OBD) sensor …
ultrahigh-vacuum AFM apparatus equipped with an optical beam deflection (OBD) sensor …