Metal–semiconductor (MS) contacts are main aspects of almost all electronic circuit
elements. Thus, contact mechanism and its electrical properties to develop a faster and …

We prepared a simple program for basic electrical measurements and parameter extraction
from these measurements of metal–semiconductor (MS) contacts. In this paper, we introduce …

A simple and reliable controlled sampling interval (CSI) method is proposed for improving
the sampling resolution of periodic signals of analog-to-digital converters (ADC). The …

Static characteristics of an analog-to-digital converter (ADC) can be directly determined from
the histogram-based quasi-static approach by measuring the ADC output when excited by …

Prohibitive test time, nonuniformity of excitation, and signal nonlinearity are major concerns
associated with employing dc, sine, and triangular/ramp signals, respectively, while …

Despite great advances in very large scale integrated-circuit design and manufacturing,
performance of even the best available high-speed, high-resolution analog-to-digital …

本篇論文為改善週期性尖銳快速訊號(spike shape waveform) 之解析度與訊號重組,
提出“週期取樣重疊”(Cycle Sample Overlap, CSO) 演算法. 本篇論文包含二個主題, 分別是(i) …

Based on existing analog to digital converters (ADC), this study proposes a simple and
reliable controlled phase shift (CPS) method to improve the sampling resolution of a periodic …