Applications of atomic layer deposition to nanofabrication and emerging nanodevices

H Kim, WJ Maeng - Thin solid films, 2009 - Elsevier
Recently, with scaling down of semiconductor devices, need for nanotechnology has
increased enormously. For nanoscale devices especially, each of the layers should be as …

Advanced electronic and optoelectronic materials by Atomic Layer Deposition: An overview with special emphasis on recent progress in processing of high‐k …

L Niinistö, M Nieminen, J Päiväsaari… - … status solidi (a), 2004 - Wiley Online Library
The principle and practice of Atomic Layer Deposition (ALD) are described with special
emphasis on the advantages of the method for processing of thin films for advanced …

Method for manufacturing a low defect interface between a dielectric and a III-V compound

C Merckling - US Patent 8,314,017, 2012 - Google Patents
The present invention is related to a method for manufacturing a low defect interface
between a dielectric material and an III-V compound. More specifically, the present invention …

III–V compound semiconductor transistors—from planar to nanowire structures

H Riel, LE Wernersson, M Hong, JA Del Alamo - Mrs Bulletin, 2014 - cambridge.org
Conventional silicon transistor scaling is fast approaching its limits. An extension of the logic
device roadmap to further improve future performance increases of integrated circuits is …

Method of depositing rare earth oxide thin films

J Niinistō, M Putkonen, M Ritala, P Räisänen… - US Patent …, 2005 - Google Patents
The present invention concerns a process for depositing rare earth oxide thin films,
especially yttrium, lanthanum and gadolinium oxide thin films by an ALD process, according …

Surface passivation of III-V compound semiconductors using atomic-layer-deposition-grown Al2O3

ML Huang, YC Chang, CH Chang, YJ Lee… - Applied Physics …, 2005 - pubs.aip.org
Al 2 O 3 was deposited on In 0.15 Ga 0.85 As∕ GaAs using atomic-layer deposition (ALD).
Without any surface preparation or postthermal treatment, excellent electrical properties of Al …

GaAs metal–oxide–semiconductor field-effect transistor with nanometer-thin dielectric grown by atomic layer deposition

PD Ye, GD Wilk, B Yang, J Kwo, SNG Chu… - Applied Physics …, 2003 - pubs.aip.org
A GaAs metal–oxide–semiconductor field-effect transistor MOSFET with thin Al2O3 gate
dielectric in nanometer nm range grown by atomic layer deposition is demonstrated. The nm …

'Old Chemistries' for new applications: Perspectives for development of precursors for MOCVD and ALD applications

A Devi - Coordination chemistry reviews, 2013 - Elsevier
The concept of the transformation of molecules to materials has been well established in the
field of chemical vapor deposition (CVD) and atomic layer deposition (ALD). However …

High ε gate dielectrics and for silicon

J Kwo, M Hong, AR Kortan, KT Queeney… - Applied Physics …, 2000 - pubs.aip.org
We report on growth and characterization of both epitaxial and amorphous films Gd 2 O 3 of
(ε= 14) and Y 2 O 3 (ε= 18) as the gate dielectrics for Si prepared by ultrahigh vacuum vapor …

GaAs MOSFET with oxide gate dielectric grown by atomic layer deposition

PD Ye, GD Wilk, J Kwo, B Yang… - IEEE Electron …, 2003 - ieeexplore.ieee.org
For the first time, a III-V compound semiconductor MOSFET with the gate dielectric grown by
atomic layer deposition (ALD) is demonstrated. The novel application of the ALD process on …