Current understanding of bias-temperature instabilities in GaN MIS transistors for power switching applications

M Ťapajna - Crystals, 2020 - mdpi.com
GaN-based high-electron mobility transistors (HEMTs) have brought unprecedented
performance in terms of power, frequency, and efficiency. Application of metal-insulator …

Dynamic on-resistance in GaN power devices: Mechanisms, characterizations, and modeling

S Yang, S Han, K Sheng… - IEEE Journal of Emerging …, 2019 - ieeexplore.ieee.org
Gallium nitride (GaN) power devices enable power electronic systems with enhanced power
density and efficiency. Dynamic on-resistance (R ON) degradation (or current collapse) …

Investigation of In Situ SiN as Gate Dielectric and Surface Passivation for GaN MISHEMTs

H Jiang, C Liu, Y Chen, X Lu… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
In this paper, we present a systematic investigation of metal–organic chemical vapor
deposition-grown in situ SiN as the gate dielectric and surface passivation for AlGaN/GaN …

Improved operation stability of Al2O3/AlGaN/GaN MOS high-electron-mobility transistors grown on GaN substrates

Y Ando, S Kaneki, T Hashizume - Applied Physics Express, 2019 - iopscience.iop.org
This paper presents electrical characterization of Al 2 O 3/AlGaN/GaN metal–oxide–
semiconductor (MOS) high-electron-mobility transistors (HEMTs) grown on GaN substrates …

Monolithic GaN half-bridge stages with integrated gate drivers for high temperature DC-DC buck converters

M Cui, R Sun, Q Bu, W Liu, H Wen, A Li, YC Liang… - IEEE …, 2019 - ieeexplore.ieee.org
This paper presents a GaN based synchronous buck DC-DC converter, which monolithically
integrates gate drivers and a half-bridge power stage in a 3-μm enhancement-mode (E …

Over 1200 V normally-OFF p-NiO gated AlGaN/GaN HEMTs on Si with a small threshold voltage shift

H Guo, H Gong, P Shao, X Yu, J Wang… - IEEE Electron …, 2021 - ieeexplore.ieee.org
In this letter, we demonstrated a normally-off AlGaN/GaN HEMT using p-NiO as a gate stack
combined with a recess structure. The fabricated HEMT exhibits a positive threshold voltage …

Worst-case bias for high voltage, elevated-temperature stress of AlGaN/GaN HEMTs

PF Wang, X Li, EX Zhang, R Jiang… - … on Device and …, 2020 - ieeexplore.ieee.org
The effects of high-field stress are evaluated for industrial-quality AlGaN/GaN HEMTs as a
function of bias and temperature. Positive and negative threshold voltage shifts are …

E-mode AlGaN/GaN HEMTs using p-NiO gates

CC Chiang, HH Wan, JS Li, F Ren, TJ Yoo… - Journal of Vacuum …, 2023 - pubs.aip.org
Sputtered p-NiO films were used to suppress gate leakage and produce a positive shift in
the gate voltage of AlGaN/GaN high-electron mobility transistors for e-mode operation. A …

Fabrication of High-Uniformity and High-Reliability Si3N4/AlGaN/GaN MIS-HEMTs With Self-Terminating Dielectric Etching Process in a 150-mm Si Foundry

H Sun, M Wang, J Chen, P Liu, W Kuang… - … on Electron Devices, 2018 - ieeexplore.ieee.org
A novel early gate dielectric AlGaN/GaN metal-insulator-semiconductor high-electron-
mobility transistors (MIS-HEMTs) process is reported. With the highquality Si 3 N 4 dielectric …

Effective suppression of interface states in recessed-gate MIS-HEMTs by TMAH wet etching

Y Li, G Yu, H Wang, J Zhou, Z Wang… - Applied Physics …, 2023 - iopscience.iop.org
The effect of tetramethylammonium hydroxide (TMAH) treatment prior to gate dielectric
deposition on the performance of recessed-gate AlGaN/GaN metal-insulator-semiconductor …