Testability and dependability of AI hardware: Survey, trends, challenges, and perspectives

F Su, C Liu, HG Stratigopoulos - IEEE Design & Test, 2023 - ieeexplore.ieee.org
Hardware realization of artificial intelligence (AI) requires new design styles and even
underlying technologies than those used in traditional digital processors or logic circuits …

RHS-TRNG: A resilient high-speed true random number generator based on STT-MTJ device

S Fu, T Li, C Zhang, H Li, S Ma, J Zhang… - … Transactions on Very …, 2023 - ieeexplore.ieee.org
High-quality random numbers are very critical to many fields such as cryptography, finance,
and scientific simulation, which calls for the design of reliable true random number …

A low-energy DMTJ-based ternary content-addressable memory with reliable sub-nanosecond search operation

E Garzón, L Yavits, G Finocchio, M Carpentieri… - IEEE …, 2023 - ieeexplore.ieee.org
In this paper, we propose an energy-efficient, reliable, hybrid, 10-transistor/2-Double-Barrier-
Magnetic-Tunnel-Junction (10T2DMTJ) non-volatile (NV) ternary content-addressable …

Smart Hammering: A practical method of pinhole detection in MRAM memories

SB Mamaghani, C Münch, J Yun… - … , Automation & Test …, 2023 - ieeexplore.ieee.org
As we move toward the commercialization of Spin-Transfer Torque Magnetic Random
Access Memories (STT-MRAM), cost-effective testing and in-field reliability have become …

Testing scouting logic-based computation-in-memory architectures

M Fieback, S Nagarajan, R Bishnoi… - 2020 IEEE European …, 2020 - ieeexplore.ieee.org
Today's von Neumann computing systems are facing major challenges making them not
suitable for evolving ultralow power (eg, edge computing) applications. Therefore …

Survey on STT-MRAM testing: Failure mechanisms, fault models, and tests

L Wu, M Taouil, S Rao, EJ Marinissen… - arXiv preprint arXiv …, 2020 - arxiv.org
As one of the most promising emerging non-volatile memory (NVM) technologies, spin-
transfer torque magnetic random access memory (STT-MRAM) has attracted significant …

Impact of magnetic coupling and density on STT-MRAM performance

L Wu, S Rao, M Taouil, EJ Marinissen… - … , Automation & Test …, 2020 - ieeexplore.ieee.org
As a unique mechanism for MRAMs, magnetic coupling needs to be accounted for when
designing memory arrays. This paper models both intra-and inter-cell magnetic coupling …

Characterization, modeling and test of synthetic anti-ferromagnet flip defect in STT-MRAMs

L Wu, S Rao, M Taouil, EJ Marinissen… - 2020 IEEE …, 2020 - ieeexplore.ieee.org
Understanding the manufacturing defects in magnetic tunnel junctions (MTJs), which are the
data-storing elements in STT-MRAMs, and their resultant faulty behaviors are crucial for …

A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory Architectures

SB Mamaghani, P Pal… - 2024 29th Asia and South …, 2024 - ieeexplore.ieee.org
Computation-in-memory (CIM) is a promising solution to tackle the memory wall problem in
big data and artificial intelligence applications. One possible approach to implement such a …

Special session: Stt-mrams: Technology, design and test

A Gebregiorgis, L Wu, C Münch, S Rao… - 2022 IEEE 40th VLSI …, 2022 - ieeexplore.ieee.org
STT-MRAM has long been a promising non-volatile memory solution for the embedded
application space owing to its attractive characteristics such as non-volatility, low leakage …