Safety evaluation of automotive electronics using virtual prototypes: State of the art and research challenges

JH Oetjens, N Bannow, M Becker… - Proceedings of the 51st …, 2014 - dl.acm.org
Intelligent automotive electronics significantly improved driving safety in the last decades.
With the increasing complexity of automotive systems, dependability of the electronic …

A machine learning based hard fault recuperation model for approximate hardware accelerators

FN Taher, J Callenes-Sloan, BC Schafer - Proceedings of the 55th …, 2018 - dl.acm.org
Continuous pursuit of higher performance and energy efficiency has led to heterogeneous
SoC that contains multiple dedicated hardware accelerators. These accelerators exploit the …

A HW/SW cross-layer approach for determining application-redundant hardware faults in embedded systems

C Bartsch, C Villarraga, D Stoffel, W Kunz - Journal of Electronic Testing, 2017 - Springer
Hardware devices of recent technology nodes are intrinsically more susceptible to faults
than previous devices. This demands further improvements of error detection methods …

A HW-dependent software model for cross-layer fault analysis in embedded systems

C Bartsch, N Rödel, C Villarraga… - 2016 17th Latin …, 2016 - ieeexplore.ieee.org
With the advent of new microelectronic fabrication technologies new hardware devices are
emerging which suffer from an intrinsically higher susceptibility to faults than previous …

[PDF][PDF] Software impact on System Reliability: Metrics and Models

System reliability has become an important design aspect for computer systems due to the
aggressive technology miniaturization, which introduces a large set of different sources of …

[图书][B] Fault Tolerance in Hardware Accelerators: Detection and Mitigation

FN Taher - 2019 - search.proquest.com
In the age of self-driving cars and space adventures, fault tolerance has become a first-order
design metric. Thus, it is vital to incorporate fault tolerance coherently into the Very Large …

[PDF][PDF] Profiling benchmarks to characterize the failures for approximate memory

A Tondwalkar, H Li - atondwal.org
Traditional techniques for providing memory reliability have a onesize-fits-all approach to
error correction, which is inefficient and costly because all memory are treated the same …

Leakage current variability based power management

E Kruglick - US Patent 9,671,850, 2017 - Google Patents
US9671850B2 - Leakage current variability based power management - Google Patents
US9671850B2 - Leakage current variability based power management - Google Patents …