Analysis of the Single-Event Latch-up Cross Section of a 16nm FinFET System-on-Chip using Backside Single-Photon Absorption Laser Testing and Correlation with …

M Fongral, V Pouget, F Saigné… - … on Nuclear Science, 2024 - ieeexplore.ieee.org
The single-event latch-up (SEL) cross section of a 16nm bulk finFET programmable system-
on-chip (SoC) is investigated by combining single photon absorption (SPA) laser testing …

Physics-based Analytical Modeling of CMOS Latchup

GI Zebrev - arXiv preprint arXiv:2408.07523, 2024 - arxiv.org
Analysis of the steady-state Kirchhoff equations within the framework of a new physics-
based equivalent circuit provides explicit expressions for the holding voltage and current for …

Single Event Latch-up (SEL) Rate Prediction Methodology in Bulk FinFET Technology

TH Chiang, CY Huang, WJ Lin, JW Lee… - 2024 46th Annual …, 2024 - ieeexplore.ieee.org
A single event latch-up (SEL) rate prediction methodology for CMOS logics is proposed. The
SEL failure rates at varied operating voltage and temperature can be predicted via the …

A Single-Event Latchup setup for high-precision AMS circuits

G Leger, A Gines, E Peralias… - 2023 IEEE European …, 2023 - ieeexplore.ieee.org
One of the most critical radiation effects, because it is potentially destructive, is the Single-
Event Latchup (SEL). Positive feedback in parasitic bipolar structures, triggered by a current …