Secondary electron contrast in low-vacuum∕ environmental scanning electron microscopy of dielectrics

BL Thiel, M Toth - Journal of applied physics, 2005 - pubs.aip.org
Low vacuum scanning electron microscopy (SEM) is a high-resolution technique, with the
ability to obtain secondary electron images of uncoated, nonconductive specimens. This feat …

Environmental TEM Study of Electron Beam Induced Electrochemistry of Pr0.64Ca0.36MnO3 Catalysts for Oxygen Evolution

S Mildner, M Beleggia, D Mierwaldt… - The Journal of …, 2015 - ACS Publications
Environmental transmission electron microscopy (ETEM) studies offer great potential for
gathering atomic scale information on the electronic state of electrodes in contact with …

A brief discussion about image quality and SEM methods for quantitative fractography of polymer composites

LRO Hein, KA Campos, P Caltabiano, KG Kostov - Scanning, 2013 - Wiley Online Library
The methodology for fracture analysis of polymeric composites with scanning electron
microscopes (SEM) is still under discussion. Many authors prefer to use sputter coating with …

Use of environmental scanning electron microscopy to image poly (N-isopropylacrylamide) microgel particles

MJ Garcia-Salinas, AM Donald - Journal of colloid and interface science, 2010 - Elsevier
Poly (N-isopropylacrylamide) microgel samples previously characterized with several
techniques [MJ García-Salinas, MS Romero-Cano, FJ de las Nieves, J. Colloid Interface Sci …

Electron scattering cross-section measurements in ESEM

GD Danilatos - Micron, 2013 - Elsevier
A review, analysis and discussion on the derivation and measurement of electron scattering
cross-sections of gases mostly used in environmental scanning electron microscopy is …

Skirting effects in the variable pressure scanning electron microscope: Limitations and improvements

A Zoukel, L Khouchaf, JD Martino, D Ruch - Micron, 2013 - Elsevier
A new approach has been initiated to improve the spatial lateral resolution of the X-ray
microanalysis and the backscattered electrons modes in variable pressure or environmental …

[PDF][PDF] Monte Carlo study of the interaction volume changes by the beam skirt in Vp-Sem

M El Azzouzi, L Khouchaf, A Achahbar - Acta Physica Polonica A, 2017 - bibliotekanauki.pl
In this work we present a new contribution for tracking the behavior of electron beam in gas
and then in material placed in the chamber of a variable pressure scanning electron …

Pressure and scattering regime influence on the EDS profile resolution at a composite interface in environmental SEM

C Arnoult, J Di Martino, L Khouchaf, V Toniazzo… - Micron, 2011 - Elsevier
Gas impact on the EDS profile resolution at the interface of composite interface resin/Al was
investigated with two gaseous environments: helium and water vapor. Two main …

Low voltage and variable-pressure scanning electron microscopy of fractured composites

LR de Oliveira Hein, KA de Campos… - Micron, 2012 - Elsevier
Uncoated fracture surfaces of carbon–epoxy composites are investigated using a variable-
pressure environmental scanning electron microscope (VP-ESEM), under optimized …

Micro-attenuated total reflection spectral imaging in archaeology: application to Maya paint and plaster wall decorations

RA Goodall, J Hall, RJ Sharer, L Traxler… - Applied …, 2008 - journals.sagepub.com
Fourier transform infrared (FT-IR) attenuated total reflection (ATR) imaging has been
successfully used to identify individual mineral components of ancient Maya paint. The high …