A review on power supply induced jitter

JN Tripathi, VK Sharma… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
The primary focus of this paper is to discuss the modeling of jitter caused by power supply
noise (PSN), named power supply induced jitter (PSIJ). A holistic discussion is presented …

P5: A protocol for scalable anonymous communication

R Sherwood, B Bhattacharjee… - Journal of Computer …, 2005 - content.iospress.com
We present a protocol for anonymous communication over the Internet. Our protocol, called
P 5 (Peer-to-Peer Personal Privacy Protocol) provides sender–, receiver–, and sender …

[图书][B] The VLSI handbook

WK Chen - 1999 - taylorfrancis.com
Over the years, the fundamentals of VLSI technology have evolved to include a wide range
of topics and a broad range of practices. To encompass such a vast amount of knowledge …

Analytic models for crosstalk delay and pulse analysis under non-ideal inputs

W Chen, SK Gupta, MA Breuer - Proceedings International Test …, 1997 - ieeexplore.ieee.org
In this paper we develop a general methodology to analyze crosstalk to obtain insight into
effects that are likely to cause errors in deep submicron high speed circuits. We focus on …

Test generation for crosstalk-induced delay in integrated circuits

WY Chen, SK Gupta, MA Breuer - … Test Conference 1999 …, 1999 - ieeexplore.ieee.org
Due to technology scaling and increasing clock frequency, problems due to noise effects
lead to an increase in design/debugging efforts and a decrease in circuit performance. This …

Analytical transient response and propagation delay evaluation of the CMOS inverter for short-channel devices

L Bisdounis, S Nikolaidis… - IEEE Journal of Solid …, 1998 - ieeexplore.ieee.org
In this paper an accurate, analytical model for the evaluation of the CMOS inverter transient
response and propagation delay for short-channel devices is presented. An exhaustive …

Test generation in VLSI circuits for crosstalk noise

W Chen, SK Gupta, MA Breuer - Proceedings International Test …, 1998 - ieeexplore.ieee.org
This paper addresses the problem of efficiently and accurately generating two-vector tests
for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital …

Single-event transient pulse propagation in digital CMOS

LW Massengill, PW Tuinenga - IEEE Transactions on nuclear …, 2008 - ieeexplore.ieee.org
Dynamic circuit equations are used to analyze the response of CMOS inverter chains to
stimuli of various forms. Using a normalized description of the CMOS inverter, the conditions …

Transistor sizing for radiation hardening

Q Zhou, K Mohanram - 2004 IEEE International Reliability …, 2004 - ieeexplore.ieee.org
This paper presents an efficient and accurate numerical analysis technique to simulate
single event upsets (SEUs) in logic circuits. Experimental results that show the method is …

Soft error rate analysis for combinational logic using an accurate electrical masking model

F Wang, Y Xie - IEEE Transactions on Dependable and Secure …, 2009 - ieeexplore.ieee.org
Accurate electrical masking modeling represents a significant challenge in soft error rate
analysis for combinational logic circuits. In this paper, we use table lookup MOSFET models …