Variability mitigation in nanometer CMOS integrated systems: A survey of techniques from circuits to software

A Rahimi, L Benini, RK Gupta - Proceedings of the IEEE, 2016 - ieeexplore.ieee.org
Variation in performance and power across manufactured parts and their operating
conditions is an accepted reality in modern microelectronic manufacturing processes with …

Efficient design of micro-scale energy harvesting systems

C Lu, V Raghunathan, K Roy - IEEE Journal on Emerging and …, 2011 - ieeexplore.ieee.org
Micro-scale energy harvesting has emerged as an attractive and increasingly feasible option
to alleviate the power supply challenge in a variety of low power applications, such as …

Adaptive body bias for reducing the impacts of NBTI and process variations on 6T SRAM cells

H Mostafa, M Anis, M Elmasry - IEEE Transactions on Circuits …, 2011 - ieeexplore.ieee.org
Reliability and variability have become big design challenges facing submicrometer SRAM
designers. A low area overhead adaptive body bias (ABB) circuit is proposed in this paper to …

Trust-based community formation in peer-to-peer file sharing networks

Y Wang, J Vassileva - … Conference on Web Intelligence (WI'04), 2004 - ieeexplore.ieee.org
Decentralized peer-to-peer (P2P) networks can benefit from forming interest-based
communities that can provide peers with information about the resources shared in the …

On-chip adaptive body bias for reducing the impact of NBTI on 6T SRAM cells

AP Shah, N Yadav, A Beohar… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
Negative bias temperature instability (NBTI) is a major reliability issue with the scaled
devices at elevated temperature. The effect of NBTI increases with the time, and it increases …

DDRO: A novel performance monitoring methodology based on design-dependent ring oscillators

TB Chan, P Gupta, AB Kahng… - … Symposium on Quality …, 2012 - ieeexplore.ieee.org
As CMOS technology scales, circuit performance becomes more sensitive to manufacturing
and environmental variations. Hence, there is a need to measure or monitor circuit …

NBTI and process variations compensation circuits using adaptive body bias

H Mostafa, M Anis, M Elmasry - IEEE transactions on …, 2012 - ieeexplore.ieee.org
Reliability and variability have become big design challenges facing submicrometer high-
speed applications and microprocessors designers. A low area overhead adaptive body …

Low-overhead maximum power point tracking for micro-scale solar energy harvesting systems

C Lu, SP Park, V Raghunathan… - 2012 25th International …, 2012 - ieeexplore.ieee.org
Environmental energy harvesting is a promising approach to achieving extremely long
operational lifetimes in a variety of micro-scale electronic systems. Maximum power point …

Analysis of instruction-level vulnerability to dynamic voltage and temperature variations

A Rahimi, L Benini, RK Gupta - … & Test in Europe Conference & …, 2012 - ieeexplore.ieee.org
Variation in performance and power across manufactured parts and their operating
conditions is an accepted reality in aggressive CMOS processes. This paper considers …

All-digital on-chip process sensor using ratioed inverter-based ring oscillator

YJ An, DH Jung, K Ryu, HS Yim… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
In this paper, an all-digital ON-chip process sensor using a ratioed inverter-based ring
oscillator is proposed. Two types of the ratioed inverter-based ring oscillators, nMOS and …