Application of the clustering model to time-correlated oxide breakdown events in multilevel antifuse memory cells
Time statistics for successive breakdown (BD) events in Al 2 O 3/HfO 2-based
nanolaminates aimed to the development of multilevel one-time programmable (OTP) …
nanolaminates aimed to the development of multilevel one-time programmable (OTP) …
[图书][B] Analysis and modeling of filamentary conduction in Hf0₂-based structures
A Rodríguez Fernández - 2018 - ddd.uab.cat
We are currently facing a revolution in the fields of microelectronics and information
technologies that will surely affect our way of life in the years to come. In this regard, the …
technologies that will surely affect our way of life in the years to come. In this regard, the …
Degradación y conducción multifilamentaria en estructuras MIS/MIM basadas en HfO2
J Muñoz Gorriz - 2021 - ddd.uab.cat
En aquesta tesi doctoral es realitza una extensa investigació sobre el fenomen de la ruptura
dielèctrica en dispositius metall-aïllant-semiconductor (MIS) i metall-aïllant-metall (MIM) …
dielèctrica en dispositius metall-aïllant-semiconductor (MIS) i metall-aïllant-metall (MIM) …