Study and analysis of advanced 3D multi-gate junctionless transistors

R Kumar, S Bala, A Kumar - Silicon, 2022 - Springer
As the IC technology is evolving very rapidly, the feature size of the device has been
migrating to sub-nanometre regime for achieving the high packing density. To continue with …

Incorporating bottom-up approach into device/circuit co-design for SRAM-based cache memory applications

S Tayal, B Smaani, SB Rahi… - … on Electron Devices, 2022 - ieeexplore.ieee.org
In this article, a reliable static random access memory (SRAM) circuit design is proposed for
improved thermal and electrical performance at 5-nm technology nodes. The proposed …

Analog/RF performance analysis of channel engineered high-k gate-stack based junctionless trigate-FinFET

S Tayal, A Nandi - Superlattices and Microstructures, 2017 - Elsevier
In this paper, the effect of channel parameters like channel thickness (T Si) and channel
length (L g) on the analog/RF performance of high-K gate-stack based junctionless Trigate …

Design insights into thermal performance of vertically stacked JL-NSFET with high-k gate dielectric for sub 5-nm technology node

S Valasa, S Tayal, LR Thoutam - ECS Journal of Solid State …, 2022 - iopscience.iop.org
Design Insights into Thermal Performance of Vertically Stacked JL-NSFET with High-k Gate
Dielectric for Sub 5-nm Technology Node - IOPscience Skip to content IOP Science home …

Optimization of gate-stack in junctionless Si-nanotube FET for analog/RF applications

S Tayal, A Nandi - Materials Science in Semiconductor Processing, 2018 - Elsevier
In this work, gate-stack based junctionless Si-nanotube (JLSiNT) FET is studied to
investigate the effect of high-K gate dielectric material in-conjunction with interfacial layer …

Simulation-based analysis of an L-patterned negative-capacitance dual tunnel VTFET

G Gopal, H Agrawal, H Garg… - International Journal of …, 2024 - Taylor & Francis
This paper investigates the design and analog the behaviour of an L-Patterned Negative-
Capacitance Dual Tunneling Vertical TFET (L-NC-DT-VTFET) device with the idea of corner …

Inner-gate-engineered GAA MOSFET to enhance the electrostatic integrity

B Jena, S Dash, SR Routray, GP Mishra - Nano, 2019 - World Scientific
Gate-all-around (GAA) MOSFETs are the best multi-gate MOSFET structure due to their
strong electrostatic control over the channel. The electrostatic controllability can be …

Effect of gate length on performance of 5nm node N-channel nano-sheet transistors for analog circuits

YP Pundir, R Saha, PK Pal - Semiconductor Science and …, 2020 - iopscience.iop.org
In this work, the effect of channel length on the performance of an N-channel Nano-sheet
Transistor (NST) for analog circuits has been investigated. A fully-calibrated TCAD platform …

Performance analysis of ferroelectric gaa mosfet with metal grain work function variability

B Jena, K Bhol, U Nanda, S Tayal, SR Routray - Silicon, 2022 - Springer
This work represents a unique GAA MOSFET with metal work-function variations (WFVs)
and ferroelectric material as dielectric. A random distribution of metal grain (TiN) with grain …

Temperature sensitivity analysis of inner-gate engineered JL-SiNT-FET: An Analog/RF prospective

S Tayal, V Mittal, S Jadav, S Gupta, A Nandi, B Krishan - Cryogenics, 2020 - Elsevier
This paper explores the temperature sensitivity of Inner-gate engineered junctionless silicon
nanotube FET (JL-SiNT-FET) on analog/RF performance. It is found that the reduction in the …