In recent years, many researchers have investigated bitumen surface morphology,
especially the so‐called bee‐like structures, in an attempt to relate the chemical composition …

Continuous development of atomic force microscopy and its applications is not always
supported by a rigorous theoretical treatment of the related phenomena. A proper …

Nancy A. Burnham, et. al.:“Measuring the nanomechanical propertyles and Surface forces of
materials using an atomic force microscope” J. Vac. Sci. Technol. A. Jul/Aug. 1969. Kees O …

Asymptotic nonlinear dynamics of Atomic Force Microscopy (AFM) based on Krylov-
Bogoliubov-Mitropolsky (KBM) averaging technique applied to Euler-Bernoulli model of …

Dynamic modes of an Atomic Force Microscope (AFM) can be modeled as a cantilever
beam excited near one or more resonant frequencies described by the Euler-Bernoulli PDE …

Quantitative Nanoscale Mechanical (QNM) studies in Atomic Force Microscopy (AFM) are
usually associated with the Contact and Non-Resonance modes. The extraction of QNM …

Asymptotic AFM amplitude-phase dynamics is a powerful modeling tool for the development
of AFM control systems and applications. We explain the model and demonstrate simple …

Atomic Force Microscopy (AFM) quantitative measurements are based on optimal
instrumentation and control design, as well as diagnostics, calibration of AFM probes, and …

Capabilities of atomic force microscopy (AFM) for characterization of local electrical
properties of materials are presented in this chapter. At the beginning the probe–sample …

In contact mode and in oscillatory non-resonant modes such as HybriD mode the tip-sample
forces are measured by the deflection of the cantilever. When a sample is vertically moved …