[PDF][PDF] Recent progress in metal-organic chemical vapor deposition of N-polar group-III nitrides

S Keller, H Li, M Laurent, Y Hu, N Pfaff… - Semiconductor …, 2014 - researchgate.net
Progress in metal-organic chemical vapor deposition of high quality () 0001 N-polar (Al, Ga,
In) N films on sapphire, silicon carbide and silicon substrates is reviewed with focus on key …

N-polar GaN epitaxy and high electron mobility transistors

MH Wong, S Keller, SD Nidhi… - Semiconductor …, 2013 - iopscience.iop.org
This paper reviews the progress of N-polar ($000\mathop 1\limits^\_ $) GaN high frequency
electronics that aims at addressing the device scaling challenges faced by GaN high …

Polarity in GaN and ZnO: Theory, measurement, growth, and devices

J Zuniga-Perez, V Consonni, L Lymperakis… - Applied Physics …, 2016 - pubs.aip.org
The polar nature of the wurtzite crystalline structure of GaN and ZnO results in the existence
of a spontaneous electric polarization within these materials and their associated alloys (Ga …

[HTML][HTML] Record high electron mobility and low sheet resistance on scaled-channel N-polar GaN/AlN heterostructures grown on on-axis N-polar GaN substrates by …

S Diez, S Mohanty, C Kurdak, E Ahmadi - Applied Physics Letters, 2020 - pubs.aip.org
GaN-based high electron mobility transistors (HEMTs) have demonstrated high frequency
power amplification with considerably larger output power densities than that available from …

First demonstration of an N-polar InAlGaN/GaN HEMT

R Hamwey, N Hatui, E Akso, F Wu… - IEEE Electron …, 2023 - ieeexplore.ieee.org
In this letter, we report the first N-polar InAlGaN quaternary back barrier high-electron-
mobility transistor (HEMT). The epitaxial device heterostructure was grown by metal organic …

[HTML][HTML] Model to explain the behavior of 2DEG mobility with respect to charge density in N-polar and Ga-polar AlGaN-GaN heterostructures

E Ahmadi, S Keller, UK Mishra - Journal of Applied Physics, 2016 - pubs.aip.org
There are three possible ways of reducing the charge density (ns) in the N-polar high
electron mobility transistors (HEMT) structures, by decreasing the channel thickness …

Engineering the (In, Al, Ga) N back-barrier to achieve high channel-conductivity for extremely scaled channel-thicknesses in N-polar GaN high-electron-mobility …

J Lu, X Zheng, M Guidry, D Denninghoff… - Applied Physics …, 2014 - pubs.aip.org
Scaling down the channel-thickness (t ch) in GaN/(In, Al, Ga) N high-electron-mobility-
transistors (HEMTs) is essential to eliminating short-channel effects in sub 100 nm gate …

HfO2 as gate insulator on N-polar GaN–AlGaN heterostructures

CJ Clymore, S Mohanty, ZA Jian… - Semiconductor …, 2021 - iopscience.iop.org
To further increase the operation frequency of GaN high electron mobility transistors
(HEMTs) with high power gain in the mm-wave band (30–300 GHz), channel thickness must …

N-polar III-nitride transistors

MH Wong, UK Mishra - Semiconductors and Semimetals, 2019 - Elsevier
This chapter reviews the historical development and present status of N-polar 000 1¯ GaN
high electron mobility transistors (HEMTs) that aim at addressing the device scaling …

Elimination of columnar microstructure in N-face InAlN, lattice-matched to GaN, grown by plasma-assisted molecular beam epitaxy in the N-rich regime

E Ahmadi, R Shivaraman, F Wu, S Wienecke… - Applied Physics …, 2014 - pubs.aip.org
The microstructure of N-face InAlN layers, lattice-matched to GaN, was investigated by
scanning transmission electron microscopy and atom probe tomography. These layers were …