FinFETs: From devices to architectures

D Bhattacharya, NK Jha - Advances in Electronics, 2014 - Wiley Online Library
Since Moore's law driven scaling of planar MOSFETs faces formidable challenges in the
nanometer regime, FinFETs and Trigate FETs have emerged as their successors. Owing to …

Progress in nanoscale dry processes for fabrication of high-aspect-ratio features: How can we control critical dimension uniformity at the bottom?

K Ishikawa, K Karahashi, T Ishijima… - Japanese Journal of …, 2018 - iopscience.iop.org
In this review, we discuss the progress of emerging dry processes for nanoscale fabrication
of high-aspect-ratio features, including emerging design technology for manufacturability …

FinFET circuit design

P Mishra, A Muttreja, NK Jha - Nanoelectronic circuit design, 2011 - Springer
Fin-type field-effect transistors (FinFETs) are promising substitutes for bulk CMOS at the
nanoscale. FinFETs are double-gate devices. The two gates of a FinFET can either be …

Handling conditional discrimination

I Žliobaite, F Kamiran, T Calders - 2011 IEEE 11th international …, 2011 - ieeexplore.ieee.org
Historical data used for supervised learning may contain discrimination. We study how to
train classifiers on such data, so that they are discrimination free with respect to a given …

Recent trend of FinFET devices and its challenges: A review

RS Pal, S Sharma, S Dasgupta - 2017 Conference on …, 2017 - ieeexplore.ieee.org
Recent technological demand of FinFETs have been explored and reviewed in this work.
The downscaling of the conventional MOSFET urge to the researchers to innovate new …

Geometry dependence of total-dose effects in bulk FinFETs

I Chatterjee, EX Zhang, BL Bhuva… - … on Nuclear Science, 2014 - ieeexplore.ieee.org
<? Pub Dtl=""?> The total ionizing dose (TID) response of bulk FinFETs is investigated for
various geometry variations, such as fin width, channel length, and fin pitch. The buildup of …

FinCACTI: Architectural analysis and modeling of caches with deeply-scaled FinFET devices

A Shafaei, Y Wang, X Lin… - 2014 IEEE Computer …, 2014 - ieeexplore.ieee.org
This paper presents FinCACTI, a cache modeling tool based on CACTI which also supports
deeply-scaled FinFET devices as well as more robust SRAM cells. In particular, FinFET …

Design of logic gates and flip-flops in high-performance FinFET technology

AN Bhoj, NK Jha - IEEE transactions on very large scale …, 2013 - ieeexplore.ieee.org
With the emergence of nonplanar CMOS devices at the 22-nm node and beyond, it is highly
likely that multigate device adoption will occur in a high-performance process technology …

Tunnel FETs for ultra-low voltage digital VLSI circuits: Part II–Evaluation at circuit level and design perspectives

M Alioto, D Esseni - IEEE Transactions on Very Large Scale …, 2014 - ieeexplore.ieee.org
In Part II of this paper, the potential of tunnel FETs (TFETs) for ultra-low voltage (ULV)/ultra-
low power (ULP) operation at 32-nm node is investigated through Verilog-A simulations of …

Comparative area and parasitics analysis in FinFET and heterojunction vertical TFET standard cells

MS Kim, W Cane-Wissing, X Li, J Sampson… - ACM Journal on …, 2016 - dl.acm.org
Vertical tunnel field-effect transistors (VTFETs) have been extensively explored to overcome
the scaling limits and to improve on-current (ION) compared to standard lateral device …