[图书][B] Random telegraph signals in semiconductor devices

E Simoen, C Claeys - 2016 - iopscience.iop.org
Following their first observation in 1984, random telegraph signals (RTSs) were initially a
purely scientific tool to study fundamental aspects of defects in semiconductor devices. As …

One-by-one trap activation in silicon nanowire transistors

N Clément, K Nishiguchi, A Fujiwara… - Nature …, 2010 - nature.com
Flicker or 1/f noise in metal-oxide-semiconductor field-effect transistors (MOSFETs) has
been identified as the main source of noise at low frequency. It often originates from an …

Room-temperature discrete-charge-fluctuation dynamics of a single molecule adsorbed on a carbon nanotube

A Setiadi, H Fujii, S Kasai, K Yamashita, T Ogawa… - Nanoscale, 2017 - pubs.rsc.org
Detection and use of physical noise fluctuations in a signal provides significant advantages
in the development of bio-and neuro-sensing and functional mimicking devices. Low …

Single electron charge sensitivity of liquid-gated carbon nanotube transistors

T Sharf, NP Wang, JW Kevek, MA Brown, H Wilson… - Nano …, 2014 - ACS Publications
Random telegraph signals corresponding to activated charge traps were observed with
liquid-gated CNT FETs. The high signal-to-noise ratio that we observe demonstrates that …

[图书][B] Transport properties of molecular junctions

NA Zimbovskaya - 2013 - Springer
At present, we observe a long-lasting process of miniaturization of electronic devices. The
ultimate limit for the miniaturization of electronic components is set by the atomic scale …

Noise suppression beyond the thermal limit with nanotransistor biosensors

Y Kutovyi, I Madrid, I Zadorozhnyi, N Boichuk, SH Kim… - Scientific reports, 2020 - nature.com
Transistor biosensors are mass-fabrication-compatible devices of interest for point of care
diagnosis as well as molecular interaction studies. While the actual transistor gates in …

Characterization of oxide traps participating in random telegraph noise using charging history effects in nano-scaled MOSFETs

T Tsuchiya, N Tamura, A Sakakidani, K Sonoda… - ECS …, 2013 - iopscience.iop.org
We propose a novel method for characterizing the oxide traps that participate in random
telegraph noise (RTN) by using charging history effects on the traps. In this method, the …

Low-frequency noise spectroscopy at nanoscale: Carbon nanotube materials and devices

S Vitusevich, F Gasparyan - Carbon Nanotubes Applications on …, 2011 - books.google.com
This section presents brief description of peculiarities of carbon materials and advantages of
noise spectsroscopy for the study of unique carbon nanotubes (CNT) materials and devices …

Role of hydration on the electronic transport through molecular junctions on silicon

N Clément, D Guérin, S Pleutin, S Godey… - The Journal of …, 2012 - ACS Publications
Molecular electronics is a fascinating area of research with the ability to tune device
properties by a chemical tailoring of organic molecules. However, molecular electronics …

Low-frequency noise in individual carbon nanotube field-effect transistors with top, side and back gate configurations: effect of gamma irradiation

VA Sydoruk, K Goß, C Meyer, MV Petrychuk… - …, 2013 - iopscience.iop.org
We report on the influence of low gamma irradiation (10 4 Gy) on the noise properties of
individual carbon nanotube (CNT) field-effect transistors (FETs) with different gate …