Germanium based field-effect transistors: Challenges and opportunities

PS Goley, MK Hudait - Materials, 2014 - mdpi.com
The performance of strained silicon (Si) as the channel material for today's metal-oxide-
semiconductor field-effect transistors may be reaching a plateau. New channel materials …

Germanium surface passivation and atomic layer deposition of high-k dielectrics—a tutorial review on Ge-based MOS capacitors

Q Xie, S Deng, M Schaekers, D Lin… - Semiconductor …, 2012 - iopscience.iop.org
Due to its high intrinsic mobility, germanium (Ge) is a promising candidate as a channel
material (offering a mobility gain of approximately× 2 for electrons and× 4 for holes when …

Effective electrical passivation of Ge (100) for high-k gate dielectric layers using germanium oxide

A Delabie, F Bellenger, M Houssa, T Conard… - Applied physics …, 2007 - pubs.aip.org
In search of a proper passivation for high-k Ge metal-oxide-semiconductor devices, the
authors have deposited high-k dielectric layers on Ge O 2⁠, grown at 350–450 C in O 2⁠. Zr …

Nanocrystals for silicon-based light-emitting and memory devices

SK Ray, S Maikap, W Banerjee… - Journal of Physics D …, 2013 - iopscience.iop.org
Nanocrystals (NCs), representing a zero-dimensional system, are an ideal platform for
exploring quantum phenomena on the nanoscale, and are expected to play a major role in …

Elevated transition temperature in Ge doped VO2 thin films

A Krammer, A Magrez, WA Vitale, P Mocny… - Journal of Applied …, 2017 - pubs.aip.org
Thermochromic Ge x V 1− x O 2+ y thin films have been deposited on Si (100) substrates by
means of reactive magnetron sputtering. The films were then characterized by Rutherford …

[HTML][HTML] Mechanisms of boron diffusion in silicon and germanium

S Mirabella, D De Salvador, E Napolitani… - Journal of Applied …, 2013 - pubs.aip.org
B migration in Si and Ge matrices raised a vast attention because of its influence on the
production of confined, highly p-doped regions, as required by the miniaturization trend. In …

Electrical properties of La2O3 and HfO2∕ La2O3 gate dielectrics for germanium metal-oxide-semiconductor devices

G Mavrou, S Galata, P Tsipas, A Sotiropoulos… - Journal of Applied …, 2008 - pubs.aip.org
Germanium metal-insulator-semiconductor capacitors with La 2 O 3 dielectrics deposited at
high temperature or subjected to post deposition annealing show good electrical …

Surface defects and passivation of Ge and III–V interfaces

M Houssa, E Chagarov, A Kummel - Mrs Bulletin, 2009 - cambridge.org
The need for high-κ gate dielectrics and metal gates in advanced integrated circuits has
reopened the door to Ge and III–V compounds as potential replacements for silicon …

Gate dielectric formation and MIS interface characterization on Ge

S Takagi, T Maeda, N Taoka, M Nishizawa… - Microelectronic …, 2007 - Elsevier
Appropriate Ge surface control and resulting formation of Ge MIS interfaces with superior
interface properties are one of the most critical issues in realizing high performance Ge …

Graphene grown on Ge (0 0 1) from atomic source

G Lippert, J Dąbrowski, T Schroeder, MA Schubert… - Carbon, 2014 - Elsevier
Among the many anticipated applications of graphene, some–such as transistors for Si
microelectronics–would greatly benefit from the possibility to deposit graphene directly on a …