In this review paper, traditional and novel demodulation methods applicable to amplitude-
modulation atomic force microscopy are implemented on a widely used digital processing …

A fundamental challenge in dynamic mode atomic force microscopy (AFM) is the estimation
of the cantilever oscillation amplitude from the deflection signal, which might be distorted by …

We adjust the transient dynamics of a piezoactuated bimorph atomic force microscopy (AFM)
probe using a state feedback controller. This approach enables us to adjust the quality factor …

The atomic force microscope (AFM)[1] is a mechanical microscope capable of producing
three-dimensional images of a wide variety of sample surfaces with nanometer precision in …

In atomic force microscopy a sharp tip, supported by a cantilevered beam and interacting
locally with a sample, is raster-scanned over a surface to build a three dimensional image …

In this article, an approach is proposed to achieve simultaneous imaging and broadband
nanomechanical mapping of heterogeneous soft materials in air by using atomic force …

The real-time and accurate measurement of tip-sample interaction forces in Tapping Mode
Atomic Force Microscopy (TM-AFM) is a remaining challenge. This obstruction …

Transport at the micro scale is an essential aspect for many emerging areas including
manufacturing systems at the nanoscale. Transfer of beads decorated with cargo under the …

Optical tweezers have enabled important insights into intracellular transport through the
investigation of motor proteins, with their ability to manipulate particles at the microscale …

This paper presents the design and control of massively parallel microcantilever arrays with
multi-walled carbon nanotube tips. The integrated system can make a powerful tool for …