A benchmark between various radiation monitors employed at CERN for radiation to
electronics applications and their simulated values with the FLUKA Monte Carlo is …

Traditional heavy-ion testing for single-event effects is carried out in cyclotron facilities with
energies around 10 MeV/n. Despite their capability of providing a broad range of linear …

Fragmented heavy-ion beams obtained from the interaction of highly energetic ions with
thick targets relative to the ion ranges are proposed to mimic the high-penetration linear …

Abstract The CHARM High-energy Ions for Micro Electronics Reliability Assurance
(CHIMERA) working group at CERN is investigating the feasibility of delivering high energy …

Single event effect (SEE) testing with ultrahigh energy (UHE) heavy ions, such as the beams
provided at CERN, presents advantages related to their long ranges with a constant linear …

System-level radiation testing of electronics is evaluated, based on test examples of the
System-in-Package (SiP) module irradiations. Total ionizing dose and single event effects …

We present the progress related to CERN's capacity of delivering highly penetrating, high-
LET heavy ions for radiation effect testing of electronic components within the CHIMERA …

In order to have an independent, repeatable, consistent, and flexible method to assess and
compare heavy ion beams produced by different heavy ion irradiation facilities, a system has …

We perform Monte Carlo (MC) simulations to describe heavy ion (HI) nuclear interactions in
a broad energy range (4 MeV/n-150 GeV/n), focusing on the single event effect (SEE) sub …

A silicon detector and a diamond detector have been used at the SPS experimental North
Area at CERN for diagnostics of beams of ultra-high energy lead ions (150 GeV/nucleon) …