An expected lifetime of converters is of great importance for optimal decision-making in the
planning of modern Power Electronic (PE) systems. Hence, the lifetime management of …

High power grid-connected converters exposed to disturbances such as grid faults and
cyber-attacks may pose enormous threat to the safety of the power system. This predicament …

Presents applied theory and advanced simulation techniques for electric machines and
drives This book combines the knowledge of experts from both academia and the software …

SiC MOSFETs are a leading option for increasing the power density of power electronics;
however, for these devices to supersede the Si insulated-gate bipolar transistor, their …

With the continuous improvement of power densities and power levels for power converters,
temperature information at critical sites of the power modules has become essential in …

Ensuring the reliability of power electronic converters is a matter of great importance, and
data-driven condition monitoring techniques are cementing themselves as an important tool …

The paper reports the results of a study based on experimental data and finite element
simulations about the failure mechanism of 650 V p-doped GaN power HEMT operated in …

This paper presents a survey of existing gate driving approaches for improving reliability of
Insulated Gate Bipolar Transistors (IGBTs). An extensive and various lists of techniques are …

In this study, the thermal shock reliability of sintered Cu joints on SiC power device
application was investigated. Firstly, sintered Cu joints were used to bond chips and …

Turn-off failure under clamped inductive load, is one of the most concerns in insulated gate
bipolar transistor (IGBT) chips. Besides, this turn-off failure can be attributed to two causes …