Scanning transmission electron microscopy (STEM) has emerged as a uniquely powerful
tool for structural and functional imaging of materials on the atomic level. Driven by …

Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

Simulation of transmission electron microscopy (TEM) images or diffraction patterns is often
required to interpret experimental data. Since nuclear cores dominate electron scattering …

Over the past several decades, electron and scanning probe microscopes have become
critical components of condensed matter physics, materials science and chemistry research …

Earl J. Kirkland Third Edition Earl J. Kirkland Third Edition Page 1 Earl J. Kirkland Advanced
Computing in Electron Microscopy Third Edition Earl J. Kirkland Advanced Computing in …

Simulation of atomic-resolution image formation in scanning transmission electron
microscopy can require significant computation times using traditional methods. A recently …

The combination of III/V semiconductors with Si is very attractive, since it allows the
fabrication of high efficient optoelectronic devices like solar cells, lasers or the integration of …

The layered oxide LiNiO2 (LNO) has been extensively investigated as a cathode active
material for lithium‐ion batteries. Despite LNO's high gravimetric capacity, instability issues …

AtomAI is an open-source software package bridging instrument-specific Python libraries,
deep learning, and simulation tools into a single ecosystem. AtomAI allows direct …

Recently it has been shown that precise dose control and an increase in the overall
acquisition speed of atomic resolution scanning transmission electron microscope (STEM) …