An electrothermal model for AlGaN/GaN power HEMTs including trapping effects to improve large-signal simulation results on high VSWR

O Jardel, F De Groote, T Reveyrand… - IEEE Transactions …, 2007 - ieeexplore.ieee.org
A large-signal electrothermal model for AlGaN/GaN HEMTs including gate and drain related
trapping effects is proposed here. This nonlinear model is well formulated to preserve …

Measurement methodology for accurate modeling of SiC MOSFET switching behavior over wide voltage and current ranges

H Sakairi, T Yanagi, H Otake, N Kuroda… - … on Power Electronics, 2017 - ieeexplore.ieee.org
This paper presents two novel measurement methods to characterize silicon carbide (SiC)
MOSFET devices. The resulting data are utilized to significantly improve the extraction of a …

[图书][B] Broadband RF and microwave amplifiers

A Grebennikov, N Kumar, BS Yarman - 2017 - books.google.com
Broadband RF and Microwave Amplifiers provides extensive coverage of broadband radio
frequency (RF) and microwave power amplifier design, including well-known historical and …

A wideband multiharmonic empirical large-signal model for high-power GaN HEMTs with self-heating and charge-trapping effects

KS Yuk, GR Branner… - IEEE Transactions on …, 2009 - ieeexplore.ieee.org
A complete empirical large-signal model for high-power AlGaN/GaN HEMTs (GaN HEMT)
utilizing an improved drain current (Ids) formulation with self-heating and charge-trapping …

Modeling GaN: powerful but challenging

L Dunleavy, C Baylis, W Curtice… - IEEE Microwave …, 2010 - ieeexplore.ieee.org
As GaN technology has developed, first in research laboratories and more recently in
multiple commercial device manufacturers, the demand for improved nonlinear models has …

A reliable model parameter extraction method applied to AlGaN/GaN HEMTs

A Jarndal, R Essaadali, AB Kouki - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
In this paper, a reliable small-signal model parameter extraction method for GaN high
electron mobility transistor (HEMT) on Si substrate has been developed and validated with …

Large-signal modelling and comparison of AlGaN/GaN HEMTs and SiC MESFETs

I Angelov, K Andersson, D Schreurs… - 2006 Asia-Pacific …, 2006 - ieeexplore.ieee.org
The Large Signal (LS) model for GaN and SiC FET devices was developed and evaluated
with DC, S, and LS measurements. Special attention was paid to improve the management …

Computational Efficiency Analysis of SiC MOSFET Models in SPICE: Static Behavior

BW Nelson, AN Lemmon, BT DeBoi… - IEEE Open Journal …, 2020 - ieeexplore.ieee.org
Transient simulation of complex converter topologies is a challenging problem, especially in
detailed analysis tools like SPICE. Much of the recent literature on SPICE transistor …

RF class-S power amplifiers: State-of-the-art results and potential

A Wentzel, C Meliani, W Heinrich - 2010 IEEE MTT-S …, 2010 - ieeexplore.ieee.org
This paper reports recent results on a current-mode class-S power amplifier for the 450 MHz
band, based on GaN-HEMT MMICs. We achieve a peak output power of 8.7 W for a single …

A GaN HEMT global large-signal model including charge trapping for multibias operation

GP Gibiino, A Santarelli, F Filicori - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
This paper presents a novel empirical model for gallium nitride on silicon carbide high-
electron mobility transistors. A global state-space formulation describes charge trapping …