Recent advances in transmission electron microscopy for materials science at the EMAT Lab of the University of Antwerp

G Guzzinati, T Altantzis, M Batuk, A De Backer… - Materials, 2018 - mdpi.com
The rapid progress in materials science that enables the design of materials down to the
nanoscale also demands characterization techniques able to analyze the materials down to …

Direct determination of band gap of defects in a wide band gap semiconductor

X Yan, Q Jin, Y Jiang, T Yao, X Li, A Tao… - … Applied Materials & …, 2022 - ACS Publications
Crystal defects play an important role in the degradation and failure of semiconductor
materials and devices. Direct determination of band gap of defects is a critical step for …

Correlating the electronic structures of β-Ga2O3 to its crystal tilts induced defects at nanoscale

Y Wei, Z Zhang, C Xu, T Wang, Y Yao, J Du… - Materials Today …, 2024 - Elsevier
Crosslinking structural transformation mechanism at nanoscale to the corresponding
anisotropically electronic properties is essential to both the atomic-level controlled synthesis …

Advanced and in situ transmission electron microscopy of diamond: A review

W Jäger - Semiconductors and Semimetals, 2021 - Elsevier
The imaging, diffraction and spectroscopy methods of advanced and in situ transmission
electron microscopy (TEM) provide high-resolution characterization of structure, defects …

Nanoscale probing of resonant photonic modes in dielectric nanoparticles with focused electron beams

Q Liu, SC Quillin, DJ Masiello, PA Crozier - Physical Review B, 2019 - APS
Understanding the optical responses of nanostructures with high spatial resolution is
paramount in photonic engineering. The excitation of resonant optical-frequency geometric …

Optoelectronic Properties and Complex Dielectric Function in Multiferroics BiFeO3 Nano-Rods: Evaluation by Valence-EELS Analysis.

JE Leal-Perez, I Jarquín-Rodríguez… - Journal of Alloys and …, 2024 - Elsevier
The focus of the research reported in this article is to study and obtain the microstructural/
complex-dielectric-function/optoelectronic properties of multiferroic BiFeO 3 nano-rods by …

Measurement of the indirect band gap of diamond with EELS in STEM

S Korneychuk, G Guzzinati… - physica status solidi (a …, 2018 - Wiley Online Library
In this work, a simple method to measure the indirect band gap of diamond with electron
energy loss spectroscopy (EELS) in transmission electron microscopy (TEM) is showed. The …

Band gap measurement by nano-beam STEM with small off-axis angle transmission electron energy loss spectroscopy (TEELS)

YY Wang, Q Jin, K Zhuang, JK Choi, J Nxumalo - Ultramicroscopy, 2021 - Elsevier
An energy band gap measurement method based on nano-beam STEM with small off-axis
angle valence band transmission electron energy loss spectroscopy (TEELS) is reported …

Measurement of dielectric function and bandgap of germanium telluride using monochromated electron energy-loss spectroscopy

JS Oh, KJ Jo, MC Kang, BS An, Y Kwon, HW Lim… - Micron, 2023 - Elsevier
Using a monochromator in transmission electron microscopy, a low-energy-loss spectrum
can provide inter-and intra-band transition information for nanoscale devices with high …

Electron energy loss spectroscopy: an analytical technique for the investigation of optical and chemical properties in 2D materials and in-situ TEM holders

E Martin Moynihan - 2023 - researchrepository.ul.ie
This PhD originally started under the title “Plasmon Tailoring of 2D Transition Metal
Dichalcogenides Studied via Electron Energy Loss Spectroscopy”. The intended research …