Parametrically excited vibrations in a nonlinear damped triple-well oscillator with resonant frequency

D Chen, N Wang, Z Chen, Y Yu - Journal of Vibration Engineering & …, 2022 - Springer
Purpose This paper deals with the parametrically excited vibrations and mode transitions of
a nonlinear damped triple-well oscillator in detail. The multiple timescale structure of the …

Melnikov-threshold-triggered mixed-mode oscillations in a family of amplitude-modulated forced oscillator

Q Wang, Y Yu, Z Zhang, X Han - Journal of Low Frequency …, 2019 - journals.sagepub.com
This paper deals with the transitions through Melnikov thresholds and the corresponding fast–
slow dynamics in a family of bi-parametric mechanical oscillators subjected to an amplitude …

Accurate detection of subsurface microcavity by bimodal atomic force microscopy

L Pengtao, Z Bi, G Shang - Nanotechnology, 2024 - iopscience.iop.org
Subsurface detection capability of bimodal atomic force microscopy (AFM) was investigated
using the buried microcavity as a reference sample, prepared by partially covering a piece of …

Study on the nano machining process with a vibrating AFM tip on the polymer surface

W Liu, Y Yan, Z Hu, X Zhao, J Yan, S Dong - Applied Surface Science, 2012 - Elsevier
The polymer has been proved to be nano machined by a vibrating tip in tapping mode of
Atomic Force Microscope (AFM). The force between the tip and the surface is an important …

Dynamic mulitmode analysis of non-linear piezoelectric microcantilever probe in bistable region of tapping mode atomic force microscopy

R McCarty, SN Mahmoodi - International Journal of Non-Linear Mechanics, 2015 - Elsevier
Abstract Atomic Force Microscopy (AFM) uses a scanning process performed by a
microcantilever probe to create a three dimensional image of a nano-scale physical surface …

Frequency response analysis of nonlinear tapping-contact mode atomic force microscopy

R McCarty, SN Mahmoodi - Proceedings of the Institution of …, 2015 - journals.sagepub.com
The nonlinear vibrations of the tapping-mode atomic force microscopy probe are
investigated due to both nonlinearity in tip–sample contact force and curvature of the …

Parameter sensitivity analysis of nonlinear piezoelectric probe in tapping mode atomic force microscopy for measurement improvement

R McCarty, S Nima Mahmoodi - Journal of Applied Physics, 2014 - pubs.aip.org
The equations of motion for a piezoelectric microcantilever are derived for a nonlinear
contact force. The analytical expressions for natural frequencies and mode shapes are …

Study of biomolecules imaging using molecular dynamics simulations

M Kheirodin, HN Pishkenari, A Moosavi, A Meghdari - Nano, 2015 - World Scientific
The process of imaging a biomolecule by atomic force microscope (AFM) is modeled using
molecular dynamics (MD) simulations. Since the large normal force exerted by the tip on the …

[PDF][PDF] Effect of AFM Cantilever Geometry on the DPL Nanomachining process

AR Norouzi, M TAHMASEBPOUR - 2016 - sid.ir
With the development of micro and nanotechnology, machining methods at micro and
nanoscale have now become interesting research topics. One of the recently-proposed …

[PDF][PDF] Exposing hidden periodic orbits in scanning force

L Böttcher, H Wallner, N Kruse, W Just, I Barke… - math.uni-rostock.de
The nonlinear interaction between the tip of a scanning probe microscope (SPM) 18 and a
sample is manifested in the emergence of bifurcations and unstable branches 19 in the …