Deep traps in GaN-based structures as affecting the performance of GaN devices

AY Polyakov, IH Lee - Materials Science and Engineering: R: Reports, 2015 - Elsevier
New developments in theoretical studies of defects and impurities in III-Nitrides as pertinent
to compensation and recombination in these materials are discussed. New results on …

Hybrid functional calculations of centers in AlN and GaN

L Gordon, JL Lyons, A Janotti, CG Van de Walle - Physical Review B, 2014 - APS
Using hybrid functional calculations, we investigate the formation of DX centers in GaN and
AlN. We find that O, Si, and Ge are shallow donors in GaN, but form stable DX centers in AlN …

Stable and metastable Si negative-U centers in AlGaN and AlN

XT Trinh, D Nilsson, IG Ivanov, E Janzén… - Applied Physics …, 2014 - pubs.aip.org
Electron paramagnetic resonance studies of Si-doped Al x Ga 1− x N (0.79≤ x≤ 1.0) reveal
two Si negative-U (or DX) centers, which can be separately observed for x≥ 0.84. We found …

Persistent photoconductivity in ZnO nanowires: Influence of oxygen and argon ambient

M Madel, F Huber, R Mueller, B Amann… - Journal of Applied …, 2017 - pubs.aip.org
ZnO nanowires typically show persistent photoconductivity (PPC), which depends in their
temporal behaviour on the ambient. We investigate ZnO nanowires in oxygen and argon …

High conductivity n-Al0.6Ga0.4N by ammonia-assisted molecular beam epitaxy for buried tunnel junctions in UV emitters

J Wang, BK SaifAddin, CJ Zollner, B Bonef… - Optics …, 2021 - opg.optica.org
Highly doped n-Al_0. 6Ga_0. 4N can be used to form tunnel junctions (TJs) on deep
ultraviolet (UVC) LEDs and markedly increase the light extraction efficiency (LEE) compared …

Electron effective mass in Al0. 72Ga0. 28N alloys determined by mid-infrared optical Hall effect

S Schöche, P Kühne, T Hofmann, M Schubert… - Applied Physics …, 2013 - pubs.aip.org
The effective electron mass parameter in Si-doped Al 0.72 Ga 0.28 N is determined to be
m∗=(0.336±0.020) m 0 from mid-infrared optical Hall effect measurements. No significant …

[HTML][HTML] On the Ge shallow-to-deep level transition in Al-rich AlGaN

P Bagheri, P Reddy, S Mita, D Szymanski… - Journal of Applied …, 2021 - pubs.aip.org
Contrary to the arsenides where donors undergo stable DX transition, we find that Ge in
AlGaN does not suffer from the DX transition; instead, it undergoes a shallow donor (30 …

[HTML][HTML] Polarization-induced electrical conductivity in ultra-wide band gap AlGaN alloys

AM Armstrong, AA Allerman - Applied Physics Letters, 2016 - pubs.aip.org
Unintentionally doped (UID) AlGaN epilayers graded over Al compositions of 80%–90% and
80%–100% were grown by metal organic vapor phase epitaxy and were electrically …

Doping of high-Al-content AlGaN grown by MOCVD

D Nilsson - 2014 - diva-portal.org
Abstract The high-Al-content AlxGa1-xN, x> 0.70, is the principal wide-band-gap alloy
system to enable the development of light-emitting diodes operating at the short …

Excitation‐dependent carrier dynamics in Al‐rich AlGaN layers and multiple quantum wells

P Ščajev, S Miasojedovas, K Jarašiunas… - … status solidi (b), 2015 - Wiley Online Library
The combined temporally, spatially and spectrally‐resolved optical techniques, namely the
photoluminescence, light induced transient grating, and differential reflectivity were used for …